Electrically detected magnetic resonance study of barium and nitric oxide treatments of 4H-SiC metal-oxide-semiconductor field-effect transistors

J. P. Ashton, P. M. Lenahan, D. J. Lichtenwalner, A. J. Lelis, M. A. Anders

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Fingerprint

Dive into the research topics of 'Electrically detected magnetic resonance study of barium and nitric oxide treatments of 4H-SiC metal-oxide-semiconductor field-effect transistors'. Together they form a unique fingerprint.

Physics & Astronomy