Electro-mechanical coupling in ZnO nanowires

Md Amanul Haque, A. V. Desai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Semiconductor nanowires such as zinc oxide nanowires are projected to be the next generation materials for nanoscale sensors and actuators. They also serve as ideal systems for studying material behavior at the small scale. In this paper, we report experimental results on the mechanical properties of zinc oxide nanowires. We have designed a MEMS (microelectromechanical systems) test-bed for mechanical characterization of nanowires and use a microscale version of pick-and-place as a generic specimen preparation and manipulation technique. We performed experiments on zinc oxide nanowires inside a scanning electron microscope (SEM) and estimated the Young's modulus to be approximately 21 GPa and the fracture strain to vary from 5 % to 15 %. We attribute the difference in mechanical properties of the nanowires from bulk properties to several factors such as lower number of defects, charge redistribution at the atomic scale and surface effects.

Original languageEnglish (US)
Title of host publicationNanosensing
Subtitle of host publicationMaterials, Devices, and Systems III
DOIs
StatePublished - Dec 1 2007
EventNanosensing: Materials, Devices, and Systems III - Boston, MA, United States
Duration: Sep 11 2007Sep 12 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6769
ISSN (Print)0277-786X

Other

OtherNanosensing: Materials, Devices, and Systems III
CountryUnited States
CityBoston, MA
Period9/11/079/12/07

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Haque, M. A., & Desai, A. V. (2007). Electro-mechanical coupling in ZnO nanowires. In Nanosensing: Materials, Devices, and Systems III [676907] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6769). https://doi.org/10.1117/12.736013