Fingerprint
Dive into the research topics of 'Electromigration stress induced deformation mechanisms in free-standing platinum thin films'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Electromigration stress induced deformation mechanisms in free-standing platinum thin films
S. Kumar, M. T. Alam, Z. Connell, M. A. Haque
Research output: Contribution to journal › Article › peer-review
16
Scopus
citations