Electron emission from disordered tetrahedral carbon

Brock Landon Weiss, A. Badzian, L. Pilione, T. Badzian, W. Drawl

Research output: Contribution to conferencePaperpeer-review

1 Scopus citations

Abstract

Electron field emission tests have been performed on films grown by a modified microwave plasma assisted chemical vapor deposition diamond process. This modification includes the addition of N2 and O2 during the growth stage. Characterization of these films shows the presence of a disordered tetrahedral carbon structure. Raman spectroscopy indicates a disturbance in the cubic symmetry of the lattice and X-ray diffraction indicates a disordered tetrahedral structure. Field emission testing indicate that current densities of 0.5 mA/cm2 can be obtained for applied fields of 5-8 V/μm. The results are explained in terms of a change in the band structure and the formation of electronic states in the band gap.

Original languageEnglish (US)
Pages103-106
Number of pages4
StatePublished - Dec 1 1997
EventProceedings of the 1997 10th International Vacuum Microelectronics Conference, IVMC'97 - Kyongju, Korea
Duration: Aug 17 1997Aug 21 1997

Other

OtherProceedings of the 1997 10th International Vacuum Microelectronics Conference, IVMC'97
CityKyongju, Korea
Period8/17/978/21/97

All Science Journal Classification (ASJC) codes

  • Surfaces and Interfaces

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