TY - JOUR
T1 - Electron emission from individual nitrogen-doped multi-walled carbon nanotubes
AU - Doytcheva, Maya
AU - Kaiser, Monja
AU - Verheijen, Marcel A.
AU - Reyes-Reyes, Marisol
AU - Terrones, Mauricio
AU - De Jonge, Niels
N1 - Funding Information:
The authors are grateful to T. van Rooij for experimental help and to J.G.M. van Berkum, R. Kurt, S.A.M. Mentink, T.H. Oosterkamp and D.B. Peckys for discussions. This work has been supported by FEI Company, the European Union project CARDECOM and the Dutch Ministry of Economic Affairs (NES project). We are indebted to R. Kamalakaran, N. Grobert, M. Mayne, T. Seeger, M. Ruehle and H. Terrones for fruitful discussions and collaboration at the early stages of the CN x nanotube research work. We also thank CONACYT-México grants: W-8001-millennium initiative (MT), 37589-U (MT) and 41464-Inter American Collaboration (MT).
PY - 2004/9/21
Y1 - 2004/9/21
N2 - This report describes the measurements on individual nitrogen-doped multi-walled carbon nanotubes mounted on tungsten support tips. Both the current-voltage characteristics and the energy spectrum of the emitted electron beam revealed field emission behavior similar to that shown for the best metallic emitters. The experimental results correspond with numerical calculations based on electron microscopy images of the nanotubes. The work function was derived and amounted to 5.0 eV. Finally, it is shown that the emission process is highly sensitive to small amounts of impurities deposited on the surface of the nanotube.
AB - This report describes the measurements on individual nitrogen-doped multi-walled carbon nanotubes mounted on tungsten support tips. Both the current-voltage characteristics and the energy spectrum of the emitted electron beam revealed field emission behavior similar to that shown for the best metallic emitters. The experimental results correspond with numerical calculations based on electron microscopy images of the nanotubes. The work function was derived and amounted to 5.0 eV. Finally, it is shown that the emission process is highly sensitive to small amounts of impurities deposited on the surface of the nanotube.
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U2 - 10.1016/j.cplett.2004.08.010
DO - 10.1016/j.cplett.2004.08.010
M3 - Article
AN - SCOPUS:7944236675
VL - 396
SP - 126
EP - 130
JO - Chemical Physics Letters
JF - Chemical Physics Letters
SN - 0009-2614
IS - 1-3
ER -