Electrostrictive strain in low-permittivity dielectrics

Rattikorn Yimnirun, Paul J. Moses, Robert E. Newnham, Richard Joseph Meyer, Jr.

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

A single-beam interferometer capable of resolving displacements on the order of 10-4 Å was used to examine the field-induced displacement in several low-permittivity dielectric materials. The experimental principle and procedures of the single-beam interferometer are described in this article. The importance and the accuracy of the Maxwell stress and the thermal stress corrections are also discussed. We present in this article the field-induced strains and the apparent electrostrictive coefficients of several common dielectric materials, including Al2O3, BgO, MgO, AlN ceramics, and SiO2 glass. Under application of an electric field, these common ceramic materials become thicker in the field direction, while glasses and glass-ceramics get thinner. The magnitude of the displacements varies between 10-2 to 10-3 Å under 1 MV/m electric field. By comparison, the field-induced displacements in these common electronic materials are approximately 3 to 5 orders of magnitude smaller than those observed in relaxor materials, such as PMN and PVDF, and soft polymers.

Original languageEnglish (US)
Pages (from-to)87-98
Number of pages12
JournalJournal of Electroceramics
Volume8
Issue number2
DOIs
StatePublished - Aug 1 2002

Fingerprint

Interferometers
Permittivity
Electric fields
permittivity
Glass
Glass ceramics
ceramics
Ceramic materials
Thermal stress
glass
Polymers
interferometers
electric fields
thermal stresses
polymers
coefficients
electronics
Direction compound
polyvinylidene fluoride

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Mechanics of Materials
  • Electrical and Electronic Engineering
  • Materials Chemistry

Cite this

Yimnirun, Rattikorn ; Moses, Paul J. ; Newnham, Robert E. ; Meyer, Jr., Richard Joseph. / Electrostrictive strain in low-permittivity dielectrics. In: Journal of Electroceramics. 2002 ; Vol. 8, No. 2. pp. 87-98.
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Electrostrictive strain in low-permittivity dielectrics. / Yimnirun, Rattikorn; Moses, Paul J.; Newnham, Robert E.; Meyer, Jr., Richard Joseph.

In: Journal of Electroceramics, Vol. 8, No. 2, 01.08.2002, p. 87-98.

Research output: Contribution to journalArticle

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