Ellipsoid-based model of structure-response relationships for chiral sculptured thin films

Joseph A. Sherwin, Akhlesh Lakhtakia

Research output: Contribution to journalConference article

7 Citations (Scopus)

Abstract

Dielectric versions of helicoidal bianisotropic mediums (HBMs) have been realized recently as chiral sculptured thin films (STFs). With a view to understanding their structure-response relationships, these STFs are modeled as periodically arranged stacks of dielectric ellipsoidal inclusions in air. The inclusions are assumed to be randomly dispersed and similarly oriented in each stack, and the Bruggeman formalism is adopted for local homogenization. The constitutive properties are examined as functions of inclusion shape, volume fraction, and orientation angles. Optical signatures of the modeled thin-film HBM (TFHBM) layers, assumed axially excited, are calculated after solving a boundary value problem. Several conclusions drawn from the calculated spectrums of co- and cross-polarized reflectances and transmittances, true and apparent circular dichroisms, true and apparent linear dichroisms, ellipticity transformation, and optical rotation are presented.

Original languageEnglish (US)
Pages (from-to)250-253
Number of pages4
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4097
StatePublished - Jan 1 2000
EventComplex Mediums - San Diego, CA, USA
Duration: Jul 30 2000Aug 1 2000

Fingerprint

Ellipsoid
ellipsoids
Thin Films
Inclusion
inclusions
Thin films
thin films
Optical rotation
Ellipticity
Transmittance
ellipticity
homogenizing
Reflectance
Volume Fraction
Homogenization
boundary value problems
Boundary value problems
Volume fraction
transmittance
Signature

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

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abstract = "Dielectric versions of helicoidal bianisotropic mediums (HBMs) have been realized recently as chiral sculptured thin films (STFs). With a view to understanding their structure-response relationships, these STFs are modeled as periodically arranged stacks of dielectric ellipsoidal inclusions in air. The inclusions are assumed to be randomly dispersed and similarly oriented in each stack, and the Bruggeman formalism is adopted for local homogenization. The constitutive properties are examined as functions of inclusion shape, volume fraction, and orientation angles. Optical signatures of the modeled thin-film HBM (TFHBM) layers, assumed axially excited, are calculated after solving a boundary value problem. Several conclusions drawn from the calculated spectrums of co- and cross-polarized reflectances and transmittances, true and apparent circular dichroisms, true and apparent linear dichroisms, ellipticity transformation, and optical rotation are presented.",
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Ellipsoid-based model of structure-response relationships for chiral sculptured thin films. / Sherwin, Joseph A.; Lakhtakia, Akhlesh.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 4097, 01.01.2000, p. 250-253.

Research output: Contribution to journalConference article

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