Employing expert opinion and software metrics for reasoning about software

Norita Ahmad, Phillip A. Laplante

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

When comparing software programs based on certain qualities there is usually more than one metric that can be used. Often these metrics may contradict one another or there may be no standard acceptance thresholds. In this work we demonstrate how the Analytical Hierarchy Process (AHP) can be used to mitigate the aforementioned deficiencies in metrics-based software decision making. We illustrate the procedure by incorporating value judgments from a group of experts into an existing metrics data set to rank the design complexity in three imaging software packages. In this case the injection of expert opinion in a formalized framework minimizes the problems associated with conflicting metrics. The contribution of this work is to demonstrate how a combination of expert opinion and tool-collected measures can be used to reason about software programs. The methodology employed can be easily modified to include different metrics, applications and weights, thus providing a practical assessment tool for decision making about software.

Original languageEnglish (US)
Title of host publicationProceedings - DASC 2007
Subtitle of host publicationThird IEEE International Symposium on Dependable, Autonomic and Secure Computing
Pages119-124
Number of pages6
DOIs
StatePublished - Dec 1 2007
EventDASC 2007: Third IEEE International Symposium on Dependable, Autonomic and Secure Computing - Columbia, MD, United States
Duration: Sep 25 2007Sep 26 2007

Publication series

NameProceedings - DASC 2007: Third IEEE International Symposium on Dependable, Autonomic and Secure Computing

Other

OtherDASC 2007: Third IEEE International Symposium on Dependable, Autonomic and Secure Computing
CountryUnited States
CityColumbia, MD
Period9/25/079/26/07

All Science Journal Classification (ASJC) codes

  • Computer Science(all)
  • Electrical and Electronic Engineering

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