Enhanced absorption of light due to multiple surface-plasmon-polariton waves

Muhammad Faryad, Akhlesh Lakhtakia

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Scopus citations

Abstract

Rigorous coupled-wave analysis was used to compute the absorptance of a metallic surface-relief grating coated with a semiconductor layer. The grating is formed by periodic bumps on an otherwise planar layer of a suitable metal. When the period of the surface-relief grating is appropriate, at a certain incidence angle the incident light excites a p-polarized surface-plasmon- polariton (SPP) wave if the semiconductor layer is homogeneous. However, if the semiconductor layer is periodically non-homogeneous normal to the mean metal/semiconductor interface, more than one SPP waves with different polarization states, phase speeds, and attenuation rates can be excited. The use of a periodically nonhomogeneous semiconductor layer for excitation of multiple SPP waves with different polarization states, phase speeds, and attenuation rates can help enhance light absorption in thin-film solar cells.

Original languageEnglish (US)
Title of host publicationThin Film Solar Technology III
DOIs
StatePublished - Oct 19 2011
EventThin Film Solar Technology III - San Diego, CA, United States
Duration: Aug 21 2011Aug 22 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8110
ISSN (Print)0277-786X

Other

OtherThin Film Solar Technology III
CountryUnited States
CitySan Diego, CA
Period8/21/118/22/11

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Faryad, M., & Lakhtakia, A. (2011). Enhanced absorption of light due to multiple surface-plasmon-polariton waves. In Thin Film Solar Technology III [81100F] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8110). https://doi.org/10.1117/12.893492