Enhanced dielectric tunability in barium titanate thin films with boron additions

Jon F. Ihlefeld; William J. Borland; Jon Paul Maria

doi:10.1016/j.scriptamat.2007.11.008

Enhanced dielectric tunability in barium titanate thin films with boron additions

Jon F. Ihlefeld, William J. Borland, Jon Paul Maria

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

Boron incorporation in 650 nm thick polycrystalline BaTiO₃ films results in grain growth and dramatic dielectric response improvements. For levels between 0% and 3%, average grain size is increased from 150 to 200 nm and the maximum permittivity values are nearly doubled, with tunabilities increased to greater than 90% while maintaining high field loss tangents below 0.03. These results demonstrate a pathway for microstructure engineering and property optimization in refractory electroceramic oxide thin films without increasing the thermal budget.

Original language	English (US)
Pages (from-to)	549-552
Number of pages	4
Journal	Scripta Materialia
Volume	58
Issue number	7
DOIs	https://doi.org/10.1016/j.scriptamat.2007.11.008
State	Published - Apr 2008

All Science Journal Classification (ASJC) codes

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
Metals and Alloys

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10.1016/j.scriptamat.2007.11.008

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@article{e68e1e01377f4622a5fd29c8dd043357,

title = "Enhanced dielectric tunability in barium titanate thin films with boron additions",

abstract = "Boron incorporation in 650 nm thick polycrystalline BaTiO3 films results in grain growth and dramatic dielectric response improvements. For levels between 0% and 3%, average grain size is increased from 150 to 200 nm and the maximum permittivity values are nearly doubled, with tunabilities increased to greater than 90% while maintaining high field loss tangents below 0.03. These results demonstrate a pathway for microstructure engineering and property optimization in refractory electroceramic oxide thin films without increasing the thermal budget.",

author = "Ihlefeld, {Jon F.} and Borland, {William J.} and Maria, {Jon Paul}",

note = "Funding Information: The authors wish to acknowledge the financial support of E.I. du Pont de Nemours and Company. ",

year = "2008",

month = apr,

doi = "10.1016/j.scriptamat.2007.11.008",

language = "English (US)",

volume = "58",

pages = "549--552",

journal = "Scripta Materialia",

issn = "1359-6462",

publisher = "Elsevier Limited",

number = "7",

}

TY - JOUR

T1 - Enhanced dielectric tunability in barium titanate thin films with boron additions

AU - Ihlefeld, Jon F.

AU - Borland, William J.

AU - Maria, Jon Paul

N1 - Funding Information: The authors wish to acknowledge the financial support of E.I. du Pont de Nemours and Company.

PY - 2008/4

Y1 - 2008/4

N2 - Boron incorporation in 650 nm thick polycrystalline BaTiO3 films results in grain growth and dramatic dielectric response improvements. For levels between 0% and 3%, average grain size is increased from 150 to 200 nm and the maximum permittivity values are nearly doubled, with tunabilities increased to greater than 90% while maintaining high field loss tangents below 0.03. These results demonstrate a pathway for microstructure engineering and property optimization in refractory electroceramic oxide thin films without increasing the thermal budget.

AB - Boron incorporation in 650 nm thick polycrystalline BaTiO3 films results in grain growth and dramatic dielectric response improvements. For levels between 0% and 3%, average grain size is increased from 150 to 200 nm and the maximum permittivity values are nearly doubled, with tunabilities increased to greater than 90% while maintaining high field loss tangents below 0.03. These results demonstrate a pathway for microstructure engineering and property optimization in refractory electroceramic oxide thin films without increasing the thermal budget.

UR - http://www.scopus.com/inward/record.url?scp=38749141776&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=38749141776&partnerID=8YFLogxK

U2 - 10.1016/j.scriptamat.2007.11.008

DO - 10.1016/j.scriptamat.2007.11.008

M3 - Article

AN - SCOPUS:38749141776

SN - 1359-6462

VL - 58

SP - 549

EP - 552

JO - Scripta Materialia

JF - Scripta Materialia

IS - 7

ER -

Enhanced dielectric tunability in barium titanate thin films with boron additions

Abstract

All Science Journal Classification (ASJC) codes

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