Enhanced field emission and breakdown near the contact between metal and dielectric

Moon S. Chung, Jung P. Cheon, Alexander Mayer, Brock Landon Weiss, Nicholas M. Miskovsky, Paul H. Cutler

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

We have investigated the enhanced field emission observed at the contact between metal and dielectric. Using a two-dimensional junction consisted of metal, vacuum and dielectric, we have found that both polarization charges and space charges in dielectric are responsible for not only the field emission enhancement but dielectric breakdown. The dielectric effect is obtained according to the configuration and the value of dielectric constant.

Original languageEnglish (US)
Title of host publicationProceedings - IVNC 2011: 2011 24th International Vacuum Nanoelectronics Conference
Pages23-24
Number of pages2
StatePublished - 2011
Event2011 24th International Vacuum Nanoelectronics Conference, IVNC 2011 - Wuppertal, Germany
Duration: Jul 18 2011Jul 22 2011

Other

Other2011 24th International Vacuum Nanoelectronics Conference, IVNC 2011
CountryGermany
CityWuppertal
Period7/18/117/22/11

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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