Enhanced left/right asymmetry in reflection and transmission due to a periodic multilayer of a topological insulator and an anisotropic dielectric material

Francesco Chiadini, Vincenzo Fiumara, Akhlesh Lakhtakia, Antonio Scaglione

Research output: Contribution to journalArticle

Abstract

Very weak left/right asymmetry in reflection and transmission is offered by a layer of a topological insulator on top of a layer of an anisotropic dielectric material, but it can be enhanced very significantly by using a periodic multilayer of both types of materials. This is an attractive prospect for realizing one-way terahertz devices, because both types of materials can be grown using standard physical-vapor-deposition techniques.

Original languageEnglish (US)
Pages (from-to)1724-1732
Number of pages9
JournalApplied Optics
Volume58
Issue number7
DOIs
StatePublished - Mar 1 2019

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Multilayers
asymmetry
insulators
Physical vapor deposition
vapor deposition

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

Cite this

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Enhanced left/right asymmetry in reflection and transmission due to a periodic multilayer of a topological insulator and an anisotropic dielectric material. / Chiadini, Francesco; Fiumara, Vincenzo; Lakhtakia, Akhlesh; Scaglione, Antonio.

In: Applied Optics, Vol. 58, No. 7, 01.03.2019, p. 1724-1732.

Research output: Contribution to journalArticle

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