Enhancing the performance of non-scanning Fourier transform spectrometer by compensating manufacturing defects inherent to a Wollaston prism array

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In this paper, a method is presented for compensating of manufacturing defects in a Wollaston prism array (WPA) via post data processing. The manufactured WPA usually suffers from unequal internal wedge angles from sub-prism to sub-prism and the formation of tilted interference fringes within each sub-prism. After compensation, the spectral error induced by defects in the Wollaston prism array is significantly reduced so that the performance of a non-scanning Fourier transform spectrometer can be substantially enhanced. Experimental results are presented to demonstrate the method of compensation.

Original languageEnglish (US)
Pages (from-to)85-90
Number of pages6
JournalOptics Communications
Issue number1-3
Publication statusPublished - Aug 1 2004


All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

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