Environmental Instability and Degradation of Single- and Few-Layer WTe2Nanosheets in Ambient Conditions

Fan Ye, Jaesung Lee, Jin Hu, Zhiqiang Mao, Jiang Wei, Philip X.L. Feng

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

A detailed investigation on the degradation of WTe2 using Raman spectroscopy and surface analysis methods, including X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) was investigated. Single-, bi-, and tri-layer (1L, 2L, and 3L) WTe2 flakes are deposited on 290nm SiO2 on the top of Si. Once the samples are prepared, we promptly transfer them into a vacuum chamber and first measure Raman signals in vacuum at room temperature. Subsequently, we locate samples out of the vacuum chamber and measure them in ambient air conditions, starting from 5 minutes up to 15 days. During the measurement intervals, samples are stored in ambient conditions. We find relatively easy and fast degradation in single-layer WTe2 (less than 13 minutes for complete oxidation), which is much faster compared with that of many other 2D materials. The main driving force for degradation is oxidation of WTe2 into WOx and TeO2 on its surface, which appears to be a self-limiting process. Such unique degradation and oxidation behavior in WTe2 may result from low energy barrier for oxidation.

Original languageEnglish (US)
Pages (from-to)5802-5808
Number of pages7
JournalSmall
Volume12
Issue number42
DOIs
StatePublished - Jan 1 2016

Fingerprint

Vacuum
Degradation
Oxidation
Photoelectron Spectroscopy
Raman Spectrum Analysis
Energy barriers
Spectrum Analysis
Surface analysis
Auger electron spectroscopy
Air
Electrons
Raman spectroscopy
Temperature
X ray photoelectron spectroscopy

All Science Journal Classification (ASJC) codes

  • Biotechnology
  • Biomaterials
  • Chemistry(all)
  • Materials Science(all)
  • Engineering (miscellaneous)

Cite this

Ye, Fan ; Lee, Jaesung ; Hu, Jin ; Mao, Zhiqiang ; Wei, Jiang ; Feng, Philip X.L. / Environmental Instability and Degradation of Single- and Few-Layer WTe2Nanosheets in Ambient Conditions. In: Small. 2016 ; Vol. 12, No. 42. pp. 5802-5808.
@article{9578f2338fd1492e81cf1c3b2d5e0a46,
title = "Environmental Instability and Degradation of Single- and Few-Layer WTe2Nanosheets in Ambient Conditions",
abstract = "A detailed investigation on the degradation of WTe2 using Raman spectroscopy and surface analysis methods, including X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) was investigated. Single-, bi-, and tri-layer (1L, 2L, and 3L) WTe2 flakes are deposited on 290nm SiO2 on the top of Si. Once the samples are prepared, we promptly transfer them into a vacuum chamber and first measure Raman signals in vacuum at room temperature. Subsequently, we locate samples out of the vacuum chamber and measure them in ambient air conditions, starting from 5 minutes up to 15 days. During the measurement intervals, samples are stored in ambient conditions. We find relatively easy and fast degradation in single-layer WTe2 (less than 13 minutes for complete oxidation), which is much faster compared with that of many other 2D materials. The main driving force for degradation is oxidation of WTe2 into WOx and TeO2 on its surface, which appears to be a self-limiting process. Such unique degradation and oxidation behavior in WTe2 may result from low energy barrier for oxidation.",
author = "Fan Ye and Jaesung Lee and Jin Hu and Zhiqiang Mao and Jiang Wei and Feng, {Philip X.L.}",
year = "2016",
month = "1",
day = "1",
doi = "10.1002/smll.201601207",
language = "English (US)",
volume = "12",
pages = "5802--5808",
journal = "Small",
issn = "1613-6810",
publisher = "Wiley-VCH Verlag",
number = "42",

}

Environmental Instability and Degradation of Single- and Few-Layer WTe2Nanosheets in Ambient Conditions. / Ye, Fan; Lee, Jaesung; Hu, Jin; Mao, Zhiqiang; Wei, Jiang; Feng, Philip X.L.

In: Small, Vol. 12, No. 42, 01.01.2016, p. 5802-5808.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Environmental Instability and Degradation of Single- and Few-Layer WTe2Nanosheets in Ambient Conditions

AU - Ye, Fan

AU - Lee, Jaesung

AU - Hu, Jin

AU - Mao, Zhiqiang

AU - Wei, Jiang

AU - Feng, Philip X.L.

PY - 2016/1/1

Y1 - 2016/1/1

N2 - A detailed investigation on the degradation of WTe2 using Raman spectroscopy and surface analysis methods, including X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) was investigated. Single-, bi-, and tri-layer (1L, 2L, and 3L) WTe2 flakes are deposited on 290nm SiO2 on the top of Si. Once the samples are prepared, we promptly transfer them into a vacuum chamber and first measure Raman signals in vacuum at room temperature. Subsequently, we locate samples out of the vacuum chamber and measure them in ambient air conditions, starting from 5 minutes up to 15 days. During the measurement intervals, samples are stored in ambient conditions. We find relatively easy and fast degradation in single-layer WTe2 (less than 13 minutes for complete oxidation), which is much faster compared with that of many other 2D materials. The main driving force for degradation is oxidation of WTe2 into WOx and TeO2 on its surface, which appears to be a self-limiting process. Such unique degradation and oxidation behavior in WTe2 may result from low energy barrier for oxidation.

AB - A detailed investigation on the degradation of WTe2 using Raman spectroscopy and surface analysis methods, including X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) was investigated. Single-, bi-, and tri-layer (1L, 2L, and 3L) WTe2 flakes are deposited on 290nm SiO2 on the top of Si. Once the samples are prepared, we promptly transfer them into a vacuum chamber and first measure Raman signals in vacuum at room temperature. Subsequently, we locate samples out of the vacuum chamber and measure them in ambient air conditions, starting from 5 minutes up to 15 days. During the measurement intervals, samples are stored in ambient conditions. We find relatively easy and fast degradation in single-layer WTe2 (less than 13 minutes for complete oxidation), which is much faster compared with that of many other 2D materials. The main driving force for degradation is oxidation of WTe2 into WOx and TeO2 on its surface, which appears to be a self-limiting process. Such unique degradation and oxidation behavior in WTe2 may result from low energy barrier for oxidation.

UR - http://www.scopus.com/inward/record.url?scp=84994248998&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84994248998&partnerID=8YFLogxK

U2 - 10.1002/smll.201601207

DO - 10.1002/smll.201601207

M3 - Article

VL - 12

SP - 5802

EP - 5808

JO - Small

JF - Small

SN - 1613-6810

IS - 42

ER -