Epitaxial YBa2Cu3O7-x thin films with tilted c-axis orientation

Yu Ya Divin, U. Poppe, J. W. Seo, Bernd C. Kabius, K. Urban

Research output: Contribution to journalArticlepeer-review

16 Scopus citations


The microstructure and electrical transport properties of the YBa2Cu3O7tx̄ thin films deposited on NdGaO3 substrates with tilted (0≤α≤45°) [110] orientation were studied. The electrical transport along the tilt (perpendicular to the rotation axis of the tilt) for low angles might be mainly attributed to the contribution of the c-axis component. The transport in the thin films with large α is effected by a network of 90° grain boundaries resulting from the domain-antidomain structure of the films. At 100 K the intrinsic resistivity ρ{variant}c along the c-axis was determined to be about 50 mΩ·cm and an anisotropy ρ{variant}c/ρ{variant}ab up to ∼600 was observed.

Original languageEnglish (US)
Pages (from-to)675-676
Number of pages2
JournalPhysica C: Superconductivity and its applications
Issue numberPART 1
StatePublished - Jan 1 1994

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering


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