Erratum: Probing domain microstructure in ferroelectric Bi4Ti3O12 thin films by optical second harmonic generation (J. Appl. Phys. (2001) 89 (1387))

Yaniv Barad, James Lettieri, Chris D. Theis, Darrell G. Schlom, Venkatraman Gopalan, J. C. Jiang, X. Q. Pan

Research output: Contribution to journalComment/debate

5 Citations (Scopus)
Original languageEnglish (US)
Number of pages1
JournalJournal of Applied Physics
Volume89
Issue number9
DOIs
StatePublished - May 1 2001

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harmonic generations
microstructure
thin films

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

@article{adf4dac82eb74059a66682a18c5cef56,
title = "Erratum: Probing domain microstructure in ferroelectric Bi4Ti3O12 thin films by optical second harmonic generation (J. Appl. Phys. (2001) 89 (1387))",
author = "Yaniv Barad and James Lettieri and Theis, {Chris D.} and Schlom, {Darrell G.} and Venkatraman Gopalan and Jiang, {J. C.} and Pan, {X. Q.}",
year = "2001",
month = "5",
day = "1",
doi = "10.1063/1.1360714",
language = "English (US)",
volume = "89",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "9",

}

Erratum : Probing domain microstructure in ferroelectric Bi4Ti3O12 thin films by optical second harmonic generation (J. Appl. Phys. (2001) 89 (1387)). / Barad, Yaniv; Lettieri, James; Theis, Chris D.; Schlom, Darrell G.; Gopalan, Venkatraman; Jiang, J. C.; Pan, X. Q.

In: Journal of Applied Physics, Vol. 89, No. 9, 01.05.2001.

Research output: Contribution to journalComment/debate

TY - JOUR

T1 - Erratum

T2 - Probing domain microstructure in ferroelectric Bi4Ti3O12 thin films by optical second harmonic generation (J. Appl. Phys. (2001) 89 (1387))

AU - Barad, Yaniv

AU - Lettieri, James

AU - Theis, Chris D.

AU - Schlom, Darrell G.

AU - Gopalan, Venkatraman

AU - Jiang, J. C.

AU - Pan, X. Q.

PY - 2001/5/1

Y1 - 2001/5/1

UR - http://www.scopus.com/inward/record.url?scp=0035340251&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035340251&partnerID=8YFLogxK

U2 - 10.1063/1.1360714

DO - 10.1063/1.1360714

M3 - Comment/debate

AN - SCOPUS:0035340251

VL - 89

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 9

ER -