Estimation of surface snow properties using combined near-infrared reflectance and millimeter-wave backscatter

Ram Mohan Narayanan, Sandy R. Jackson, Karen M. St. Germain

Research output: Contribution to conferencePaper

Abstract

Remote sensing techniques using combined concurrent measurements of near-infrared passive reflectance and millimeter-wave radar backscatter were used to estimate surface snow properties. The effectiveness of the procedure was tested using 400 combinations of surface parameters. Results indicate that a neural network approach using near-infrared and millimeter-wave measurements show promise in estimating surface snow parameters. Since the spatial resolutions attainable at near-infrared and millimeter-wave spectral regimes are different, a combination of these inversion algorithms has the potential to characterize the spatial distribution of free-water content of snow, while also providing accurate estimates of grain size and surface roughness.

Original languageEnglish (US)
Pages189-191
Number of pages3
Publication statusPublished - Jan 1 1995
EventProceedings of the 2nd Topical Symposium on Combined Optical-Microwave Earth and Atmosphere Sensing - Atlanta, GA, USA
Duration: Apr 3 1995Apr 6 1995

Other

OtherProceedings of the 2nd Topical Symposium on Combined Optical-Microwave Earth and Atmosphere Sensing
CityAtlanta, GA, USA
Period4/3/954/6/95

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All Science Journal Classification (ASJC) codes

  • Earth and Planetary Sciences(all)

Cite this

Narayanan, R. M., Jackson, S. R., & St. Germain, K. M. (1995). Estimation of surface snow properties using combined near-infrared reflectance and millimeter-wave backscatter. 189-191. Paper presented at Proceedings of the 2nd Topical Symposium on Combined Optical-Microwave Earth and Atmosphere Sensing, Atlanta, GA, USA, .