Estimation of surface snow properties using combined near-infrared reflectance and millimeter-wave backscatter

Ram Mohan Narayanan, Sandy R. Jackson, Karen M. St. Germain

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Remote sensing techniques using combined concurrent measurements of near-infrared passive reflectance and millimeter-wave radar backscatter were used to estimate surface snow properties. The effectiveness of the procedure was tested using 400 combinations of surface parameters. Results indicate that a neural network approach using near-infrared and millimeter-wave measurements show promise in estimating surface snow parameters. Since the spatial resolutions attainable at near-infrared and millimeter-wave spectral regimes are different, a combination of these inversion algorithms has the potential to characterize the spatial distribution of free-water content of snow, while also providing accurate estimates of grain size and surface roughness.

Original languageEnglish (US)
Title of host publicationCombined Optical-Microwave Earth and Atmosphere Sensing - Conference Proceedings
PublisherIEEE
Pages189-191
Number of pages3
StatePublished - 1995
EventProceedings of the 2nd Topical Symposium on Combined Optical-Microwave Earth and Atmosphere Sensing - Atlanta, GA, USA
Duration: Apr 3 1995Apr 6 1995

Other

OtherProceedings of the 2nd Topical Symposium on Combined Optical-Microwave Earth and Atmosphere Sensing
CityAtlanta, GA, USA
Period4/3/954/6/95

Fingerprint

backscatter
reflectance
near infrared
snow
surface roughness
spatial resolution
grain size
water content
radar
spatial distribution
remote sensing
parameter
inversion

All Science Journal Classification (ASJC) codes

  • Earth and Planetary Sciences(all)

Cite this

Narayanan, R. M., Jackson, S. R., & St. Germain, K. M. (1995). Estimation of surface snow properties using combined near-infrared reflectance and millimeter-wave backscatter. In Combined Optical-Microwave Earth and Atmosphere Sensing - Conference Proceedings (pp. 189-191). IEEE.
Narayanan, Ram Mohan ; Jackson, Sandy R. ; St. Germain, Karen M. / Estimation of surface snow properties using combined near-infrared reflectance and millimeter-wave backscatter. Combined Optical-Microwave Earth and Atmosphere Sensing - Conference Proceedings. IEEE, 1995. pp. 189-191
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abstract = "Remote sensing techniques using combined concurrent measurements of near-infrared passive reflectance and millimeter-wave radar backscatter were used to estimate surface snow properties. The effectiveness of the procedure was tested using 400 combinations of surface parameters. Results indicate that a neural network approach using near-infrared and millimeter-wave measurements show promise in estimating surface snow parameters. Since the spatial resolutions attainable at near-infrared and millimeter-wave spectral regimes are different, a combination of these inversion algorithms has the potential to characterize the spatial distribution of free-water content of snow, while also providing accurate estimates of grain size and surface roughness.",
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Narayanan, RM, Jackson, SR & St. Germain, KM 1995, Estimation of surface snow properties using combined near-infrared reflectance and millimeter-wave backscatter. in Combined Optical-Microwave Earth and Atmosphere Sensing - Conference Proceedings. IEEE, pp. 189-191, Proceedings of the 2nd Topical Symposium on Combined Optical-Microwave Earth and Atmosphere Sensing, Atlanta, GA, USA, 4/3/95.

Estimation of surface snow properties using combined near-infrared reflectance and millimeter-wave backscatter. / Narayanan, Ram Mohan; Jackson, Sandy R.; St. Germain, Karen M.

Combined Optical-Microwave Earth and Atmosphere Sensing - Conference Proceedings. IEEE, 1995. p. 189-191.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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T1 - Estimation of surface snow properties using combined near-infrared reflectance and millimeter-wave backscatter

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AU - Jackson, Sandy R.

AU - St. Germain, Karen M.

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Y1 - 1995

N2 - Remote sensing techniques using combined concurrent measurements of near-infrared passive reflectance and millimeter-wave radar backscatter were used to estimate surface snow properties. The effectiveness of the procedure was tested using 400 combinations of surface parameters. Results indicate that a neural network approach using near-infrared and millimeter-wave measurements show promise in estimating surface snow parameters. Since the spatial resolutions attainable at near-infrared and millimeter-wave spectral regimes are different, a combination of these inversion algorithms has the potential to characterize the spatial distribution of free-water content of snow, while also providing accurate estimates of grain size and surface roughness.

AB - Remote sensing techniques using combined concurrent measurements of near-infrared passive reflectance and millimeter-wave radar backscatter were used to estimate surface snow properties. The effectiveness of the procedure was tested using 400 combinations of surface parameters. Results indicate that a neural network approach using near-infrared and millimeter-wave measurements show promise in estimating surface snow parameters. Since the spatial resolutions attainable at near-infrared and millimeter-wave spectral regimes are different, a combination of these inversion algorithms has the potential to characterize the spatial distribution of free-water content of snow, while also providing accurate estimates of grain size and surface roughness.

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Narayanan RM, Jackson SR, St. Germain KM. Estimation of surface snow properties using combined near-infrared reflectance and millimeter-wave backscatter. In Combined Optical-Microwave Earth and Atmosphere Sensing - Conference Proceedings. IEEE. 1995. p. 189-191