Evaluating the scalability of multilayer MoS2 transistors

Saptarshi Das, Joerg Appenzeller

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Scopus citations
Original languageEnglish (US)
Title of host publication71st Device Research Conference, DRC 2013 - Conference Digest
Pages153-154
Number of pages2
DOIs
StatePublished - Dec 16 2013
Event71st Device Research Conference, DRC 2013 - Notre Dame, IN, United States
Duration: Jun 23 2013Jun 26 2013

Other

Other71st Device Research Conference, DRC 2013
CountryUnited States
CityNotre Dame, IN
Period6/23/136/26/13

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Das, S., & Appenzeller, J. (2013). Evaluating the scalability of multilayer MoS2 transistors. In 71st Device Research Conference, DRC 2013 - Conference Digest (pp. 153-154). [6633839] https://doi.org/10.1109/DRC.2013.6633839