Evaluating the scalability of multilayer MoS2 transistors

Evaluating the scalability of multilayer MoS₂ transistors

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	71st Device Research Conference, DRC 2013 - Conference Digest
Pages	153-154
Number of pages	2
DOIs	https://doi.org/10.1109/DRC.2013.6633839
State	Published - Dec 16 2013
Event	71st Device Research Conference, DRC 2013 - Notre Dame, IN, United States Duration: Jun 23 2013 → Jun 26 2013

Other	71st Device Research Conference, DRC 2013
Country	United States
City	Notre Dame, IN
Period	6/23/13 → 6/26/13

Das, S., & Appenzeller, J. (2013). Evaluating the scalability of multilayer MoS₂ transistors. In 71st Device Research Conference, DRC 2013 - Conference Digest (pp. 153-154). [6633839] https://doi.org/10.1109/DRC.2013.6633839

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