Evaluating the scalability of multilayer MoS2 transistors

Evaluating the scalability of multilayer MoS₂ transistors

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	71st Device Research Conference, DRC 2013 - Conference Digest
Pages	153-154
Number of pages	2
DOIs	https://doi.org/10.1109/DRC.2013.6633839
State	Published - Dec 16 2013
Event	71st Device Research Conference, DRC 2013 - Notre Dame, IN, United States Duration: Jun 23 2013 → Jun 26 2013

Other	71st Device Research Conference, DRC 2013
Country	United States
City	Notre Dame, IN
Period	6/23/13 → 6/26/13

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title = "Evaluating the scalability of multilayer MoS2 transistors",

author = "Saptarshi Das and Joerg Appenzeller",

year = "2013",

month = dec,

day = "16",

doi = "10.1109/DRC.2013.6633839",

language = "English (US)",

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pages = "153--154",

booktitle = "71st Device Research Conference, DRC 2013 - Conference Digest",

note = "71st Device Research Conference, DRC 2013 ; Conference date: 23-06-2013 Through 26-06-2013",

}

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AU - Appenzeller, Joerg

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BT - 71st Device Research Conference, DRC 2013 - Conference Digest

T2 - 71st Device Research Conference, DRC 2013

Y2 - 23 June 2013 through 26 June 2013

ER -