Evaluating the scalability of multilayer MoS2 transistors

Saptarshi Das; Joerg Appenzeller

doi:10.1109/DRC.2013.6633839

Evaluating the scalability of multilayer MoS₂ transistors

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	71st Device Research Conference, DRC 2013 - Conference Digest
Pages	153-154
Number of pages	2
DOIs	https://doi.org/10.1109/DRC.2013.6633839
State	Published - 2013
Event	71st Device Research Conference, DRC 2013 - Notre Dame, IN, United States Duration: Jun 23 2013 → Jun 26 2013

Publication series

Name	Device Research Conference - Conference Digest, DRC
ISSN (Print)	1548-3770

Other

Other	71st Device Research Conference, DRC 2013
Country/Territory	United States
City	Notre Dame, IN
Period	6/23/13 → 6/26/13

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Access to Document

10.1109/DRC.2013.6633839

Cite this

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title = "Evaluating the scalability of multilayer MoS2 transistors",

author = "Saptarshi Das and Joerg Appenzeller",

year = "2013",

doi = "10.1109/DRC.2013.6633839",

language = "English (US)",

isbn = "9781479908110",

series = "Device Research Conference - Conference Digest, DRC",

pages = "153--154",

booktitle = "71st Device Research Conference, DRC 2013 - Conference Digest",

note = "71st Device Research Conference, DRC 2013 ; Conference date: 23-06-2013 Through 26-06-2013",

}

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AU - Appenzeller, Joerg

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DO - 10.1109/DRC.2013.6633839

M3 - Conference contribution

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SN - 9781479908110

T3 - Device Research Conference - Conference Digest, DRC

SP - 153

EP - 154

BT - 71st Device Research Conference, DRC 2013 - Conference Digest

T2 - 71st Device Research Conference, DRC 2013

Y2 - 23 June 2013 through 26 June 2013

ER -