Evaluation of intrinsic and extrinsic contributions to the piezoelectric properties of Pb(Zr1-XTX)O3 thin films as a function of composition

Dong Joo Kim, Jon-Paul Maria, Angus I. Kingon, S. K. Streiffer

Research output: Contribution to journalArticle

138 Citations (Scopus)

Abstract

A study was performed on the evaluation of intrinsic and extrinsic contribution to the piezoelectric properties of Pb(Zr1-xTx)O3 thin films. The measurements of the nonlinear behavior and temperature dependence of relative permittivity and piezoelectric coefficients showed that non-180° domain wall motion in these films was negligible. It was found that the extrinsic contribution to the room temperature permittivity was dominated by only 180° domain wall motion.

Original languageEnglish (US)
Pages (from-to)5568-5575
Number of pages8
JournalJournal of Applied Physics
Volume93
Issue number9
DOIs
StatePublished - May 1 2003

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domain wall
permittivity
evaluation
thin films
temperature dependence
room temperature
coefficients

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

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Evaluation of intrinsic and extrinsic contributions to the piezoelectric properties of Pb(Zr1-XTX)O3 thin films as a function of composition. / Kim, Dong Joo; Maria, Jon-Paul; Kingon, Angus I.; Streiffer, S. K.

In: Journal of Applied Physics, Vol. 93, No. 9, 01.05.2003, p. 5568-5575.

Research output: Contribution to journalArticle

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