Evaluation of thin film coating adhesion with an opto-acoustic technique

Patrick F. Flowers, Sanichiro Yoshida, Kenji Gomi, Sushovit Adhikari, Katelyn Dreux, Mohan Basnet, Chiaki Miyasaka, Bernhard R. Tittmann, Ik Keun Park

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

An opto-acoustic technique to evaluate the adhesion strength at the interface of nano-scale thin film systems has been demonstrated. The specimens have been integrated into a Michelson interferometer as the end mirrors, and driven from the rear with an acoustic transducer at moderate frequencies. The resultant film surface displacement has been detected as a fringe shift of the interference intensity pattern behind the beam splitter with a digital imaging device at a normal frame rate. Comparison has been made between strongly and weakly adhered film specimens. The difference in the adhesion strength has been successfully visualized as the difference in the fringe contrast. Fourier analysis on the fringe pattern has quantified the fringe contrast.

Original languageEnglish (US)
Title of host publication2011 IEEE International Ultrasonics Symposium, IUS 2011
Pages1103-1106
Number of pages4
DOIs
StatePublished - 2011
Event2011 IEEE International Ultrasonics Symposium, IUS 2011 - Orlando, FL, United States
Duration: Oct 18 2011Oct 21 2011

Publication series

NameIEEE International Ultrasonics Symposium, IUS
ISSN (Print)1948-5719
ISSN (Electronic)1948-5727

Other

Other2011 IEEE International Ultrasonics Symposium, IUS 2011
CountryUnited States
CityOrlando, FL
Period10/18/1110/21/11

All Science Journal Classification (ASJC) codes

  • Acoustics and Ultrasonics

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