Evidence for the formation of dynamically created pre-formed ions at the interface of isotopically enriched thin films

Jordan O. Lerach, Nicholas Winograd

Research output: Contribution to journalArticle

1 Scopus citations

Abstract

A novel approach to elucidate the ionization mechanism for the [M + H] + molecular ion of organic molecules is investigated by molecular depth profiling of isotopically enriched thin films. Using a model bi-layer film of phenylalanine (PHE) and PHE-D8, the results show formation of an [M + D]+ molecular ion for the non-enriched PHE molecule attributed to rearrangements of chemical damage due to successive primary ion impacts. The [M + D]+ ion is observed at the interface for 19.9 nm in the enriched-on-top system and 9.9 nm for the enriched-on-bottom system. This ion formation is direct evidence for dynamically created pre-formed ions as a result of chemical damage rearrangement induced by previous primary ion bombardment events.

Original languageEnglish (US)
Pages (from-to)54-56
Number of pages3
JournalSurface and Interface Analysis
Volume45
Issue number1
DOIs
StatePublished - Jan 2013

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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