The recrystallization kinetics of amorphous lead zirconate-titanate films prepared by sol-gel technology are investigated experimentally using elastic scattering of light. Sequences of elastic dependences of the scattered light intensity are recorded directly during thermal annealing. The evolution of the morphology of the film surface during annealing is described in terms of the variation of their fractal dimensionalities Ds. The experimental dependences Ds(t) are compared with the results of a computer simulation of the phase transition kinetics in a thin plate (film).
|Original language||English (US)|
|Number of pages||4|
|Journal||Physics of the Solid State|
|State||Published - Feb 1999|
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics