Examining Thread Vulnerability analysis using fault-injection

Isil Oz, Haluk Rahmi Topcuoglu, Mahmut Kandemir, Oguz Tosun

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

With the scale down of transistor sizes and higher frequencies with low power modes in modern architectures, the chip components become more susceptible to transient errors. Concurrently, multicore machines are replacing traditional single-core machines in most application domains. Thread Vulnerability Factor (TVF) is a metric to evaluate relative soft error vulnerability of multithreaded applications running on multicore architectures. It makes possible vulnerability analysis of parallel programs by providing comparisons between them. In this work, we design a simulation-based fault-injection framework to evaluate soft error vulnerability of parallel applications and perform a validation study to evaluate parallel program vulnerability. The results of the simulation-based fault injection framework is compared with the results based on TVF analysis. Our results demonstrate that TVF provides an efficient vulnerability analysis by having the same ordering and similar vulnerability rates with fault-injection results for a set of multithreaded applications.

Original languageEnglish (US)
Title of host publication2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration, VLSI-SoC 2013 - Proceedings
PublisherIEEE Computer Society
Pages240-245
Number of pages6
ISBN (Print)9781479905249
DOIs
StatePublished - Jan 1 2013
Event2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration, VLSI-SoC 2013 - Istanbul, Turkey
Duration: Oct 7 2013Oct 9 2013

Publication series

NameIEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
ISSN (Print)2324-8432
ISSN (Electronic)2324-8440

Other

Other2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration, VLSI-SoC 2013
CountryTurkey
CityIstanbul
Period10/7/1310/9/13

Fingerprint

Factor analysis
Transistors

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Software
  • Electrical and Electronic Engineering

Cite this

Oz, I., Topcuoglu, H. R., Kandemir, M., & Tosun, O. (2013). Examining Thread Vulnerability analysis using fault-injection. In 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration, VLSI-SoC 2013 - Proceedings (pp. 240-245). [6673282] (IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC). IEEE Computer Society. https://doi.org/10.1109/VLSI-SoC.2013.6673282
Oz, Isil ; Topcuoglu, Haluk Rahmi ; Kandemir, Mahmut ; Tosun, Oguz. / Examining Thread Vulnerability analysis using fault-injection. 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration, VLSI-SoC 2013 - Proceedings. IEEE Computer Society, 2013. pp. 240-245 (IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC).
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Oz, I, Topcuoglu, HR, Kandemir, M & Tosun, O 2013, Examining Thread Vulnerability analysis using fault-injection. in 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration, VLSI-SoC 2013 - Proceedings., 6673282, IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC, IEEE Computer Society, pp. 240-245, 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration, VLSI-SoC 2013, Istanbul, Turkey, 10/7/13. https://doi.org/10.1109/VLSI-SoC.2013.6673282

Examining Thread Vulnerability analysis using fault-injection. / Oz, Isil; Topcuoglu, Haluk Rahmi; Kandemir, Mahmut; Tosun, Oguz.

2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration, VLSI-SoC 2013 - Proceedings. IEEE Computer Society, 2013. p. 240-245 6673282 (IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Oz I, Topcuoglu HR, Kandemir M, Tosun O. Examining Thread Vulnerability analysis using fault-injection. In 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration, VLSI-SoC 2013 - Proceedings. IEEE Computer Society. 2013. p. 240-245. 6673282. (IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC). https://doi.org/10.1109/VLSI-SoC.2013.6673282