Exciton diffusion lengths of organic semiconductor thin films measured by spectrally resolved photoluminescence quenching

Richard R. Lunt, Noel Christopher Giebink, Anna A. Belak, Jay B. Benziger, Stephen R. Forrest

Research output: Contribution to journalArticle

341 Citations (Scopus)

Abstract

We demonstrate spectrally resolved photoluminescence quenching as a means to determine the exciton diffusion length of several archetype organic semiconductors used in thin film devices. We show that aggregation and crystal orientation influence the anisotropy of the diffusion length for vacuum-deposited polycrystalline films. The measurement of the singlet diffusion lengths is found to be in agreement with diffusion by Förster transfer, whereas triplet diffusion occurs primarily via Dexter transfer.

Original languageEnglish (US)
Article number053711
JournalJournal of Applied Physics
Volume105
Issue number5
DOIs
StatePublished - Mar 24 2009

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organic semiconductors
diffusion length
quenching
excitons
photoluminescence
thin films
vacuum
anisotropy
crystals

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

@article{9820253a4ca840c3aacc04916f91e9a8,
title = "Exciton diffusion lengths of organic semiconductor thin films measured by spectrally resolved photoluminescence quenching",
abstract = "We demonstrate spectrally resolved photoluminescence quenching as a means to determine the exciton diffusion length of several archetype organic semiconductors used in thin film devices. We show that aggregation and crystal orientation influence the anisotropy of the diffusion length for vacuum-deposited polycrystalline films. The measurement of the singlet diffusion lengths is found to be in agreement with diffusion by F{\"o}rster transfer, whereas triplet diffusion occurs primarily via Dexter transfer.",
author = "Lunt, {Richard R.} and Giebink, {Noel Christopher} and Belak, {Anna A.} and Benziger, {Jay B.} and Forrest, {Stephen R.}",
year = "2009",
month = "3",
day = "24",
doi = "10.1063/1.3079797",
language = "English (US)",
volume = "105",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "5",

}

Exciton diffusion lengths of organic semiconductor thin films measured by spectrally resolved photoluminescence quenching. / Lunt, Richard R.; Giebink, Noel Christopher; Belak, Anna A.; Benziger, Jay B.; Forrest, Stephen R.

In: Journal of Applied Physics, Vol. 105, No. 5, 053711, 24.03.2009.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Exciton diffusion lengths of organic semiconductor thin films measured by spectrally resolved photoluminescence quenching

AU - Lunt, Richard R.

AU - Giebink, Noel Christopher

AU - Belak, Anna A.

AU - Benziger, Jay B.

AU - Forrest, Stephen R.

PY - 2009/3/24

Y1 - 2009/3/24

N2 - We demonstrate spectrally resolved photoluminescence quenching as a means to determine the exciton diffusion length of several archetype organic semiconductors used in thin film devices. We show that aggregation and crystal orientation influence the anisotropy of the diffusion length for vacuum-deposited polycrystalline films. The measurement of the singlet diffusion lengths is found to be in agreement with diffusion by Förster transfer, whereas triplet diffusion occurs primarily via Dexter transfer.

AB - We demonstrate spectrally resolved photoluminescence quenching as a means to determine the exciton diffusion length of several archetype organic semiconductors used in thin film devices. We show that aggregation and crystal orientation influence the anisotropy of the diffusion length for vacuum-deposited polycrystalline films. The measurement of the singlet diffusion lengths is found to be in agreement with diffusion by Förster transfer, whereas triplet diffusion occurs primarily via Dexter transfer.

UR - http://www.scopus.com/inward/record.url?scp=62549113492&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=62549113492&partnerID=8YFLogxK

U2 - 10.1063/1.3079797

DO - 10.1063/1.3079797

M3 - Article

VL - 105

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 5

M1 - 053711

ER -