Experimental and molecular-dynamics study of the Ar emission mechanism during low-energy Ar+ bombardment of Cu

H. Feil, J. Van Zwol, S. T. De Zwart, J. Dieleman, B. J. Garrison

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

Angle-resolved time-of-flight distributions of Ar atoms emitted during Ar+ bombardment of Cu have been measured and compared to results of molecular-dynamics simulations. For keV incident energies, implanted Ar atoms escape peaked along the surface normal, due to a high excitation density of the surface, induced by a nearby Ar+ impact, and the negligible attraction between Ar and Cu. At low incident energies, the simulations show that the Ar is trapped for a short time in the first Cu layers, undergoes a few collisions and is emitted in a similar direction but at higher kinetic energy.

Original languageEnglish (US)
Pages (from-to)13695-13698
Number of pages4
JournalPhysical Review B
Volume43
Issue number16
DOIs
StatePublished - Jan 1 1991

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

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