Exploring technological trends for patent evaluation

Shuting Wang, Wang Chien Lee, Zhen Lei, Xianliang Zhang, Yu Hsuan Kuo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Patents are very important intangible assets that protect firm technologies and maintain market competitiveness. Thus, patent evaluation is critical for firm business strategy and innovation management. Currently patent evaluation mostly relies on some meta information of patents, such as number of forward/backward citations and number of claims. In this paper, we propose to identify patent technological trends, which carries information about technology evolution and trajectories among patents, to enable more effective and precise patent evaluation. We explore features to capture both the value of trends and the quality of patents within a trend, and perform patent evaluation to validate the extracted trends and features using patents in the United States Patent and Trademark Office (USPTO) dataset. Experimental results demonstrate that the identified technological trends are able to capture patent value precisely. With the proposed trend related features extracted from our identified trends, we can improve patent evaluation performance significantly over the baseline using conventional features.

Original languageEnglish (US)
Title of host publicationDSAA 2014 - Proceedings of the 2014 IEEE International Conference on Data Science and Advanced Analytics
EditorsGeorge Karypis, Longbing Cao, Wei Wang, Irwin King
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages277-283
Number of pages7
ISBN (Electronic)9781479969913
DOIs
StatePublished - Mar 10 2014
Event2014 IEEE International Conference on Data Science and Advanced Analytics, DSAA 2014 - Shanghai, China
Duration: Oct 30 2014Nov 1 2014

Publication series

NameDSAA 2014 - Proceedings of the 2014 IEEE International Conference on Data Science and Advanced Analytics

Other

Other2014 IEEE International Conference on Data Science and Advanced Analytics, DSAA 2014
CountryChina
CityShanghai
Period10/30/1411/1/14

All Science Journal Classification (ASJC) codes

  • Artificial Intelligence
  • Information Systems
  • Information Systems and Management

Fingerprint Dive into the research topics of 'Exploring technological trends for patent evaluation'. Together they form a unique fingerprint.

  • Cite this

    Wang, S., Lee, W. C., Lei, Z., Zhang, X., & Kuo, Y. H. (2014). Exploring technological trends for patent evaluation. In G. Karypis, L. Cao, W. Wang, & I. King (Eds.), DSAA 2014 - Proceedings of the 2014 IEEE International Conference on Data Science and Advanced Analytics (pp. 277-283). [7058085] (DSAA 2014 - Proceedings of the 2014 IEEE International Conference on Data Science and Advanced Analytics). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DSAA.2014.7058085