Extending differential electrophoresis to measure nanoparticle forces

Darrell Velegol, G. Holtzer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A method is being developed for measuring interparticle forces between nanoparticles. Previously, the method of differential electrophoresis has been used to measure forces between micron size particles with different zeta potentials. The method used video microscopy to measure colloidal trajectories, and the electrokinetic equations to interpret the forces. The developments that will enable nanoparticle forces to be measured include measurements between identical spheres, as well as a method for "visualizing" the moment of breakage for smaller particles. This paper focuses on the first of these goals, measuring forces between identical particles by interpreting trajectories of colloidal triplets.

Original languageEnglish (US)
Title of host publicationProceedings of the 2002 2nd IEEE Conference on Nanotechnology, IEEE-NANO 2002
PublisherIEEE Computer Society
Pages343-345
Number of pages3
ISBN (Electronic)0780375386
DOIs
StatePublished - Jan 1 2002
Event2nd IEEE Conference on Nanotechnology, IEEE-NANO 2002 - Washington, United States
Duration: Aug 26 2002Aug 28 2002

Publication series

NameProceedings of the IEEE Conference on Nanotechnology
Volume2002-January
ISSN (Print)1944-9399
ISSN (Electronic)1944-9380

Other

Other2nd IEEE Conference on Nanotechnology, IEEE-NANO 2002
CountryUnited States
CityWashington
Period8/26/028/28/02

Fingerprint

electrophoresis
Electrophoresis
Trajectories
Nanoparticles
nanoparticles
Zeta potential
Microscopic examination
Particle size
trajectories
electrokinetics
microscopy
moments

All Science Journal Classification (ASJC) codes

  • Bioengineering
  • Electrical and Electronic Engineering
  • Materials Chemistry
  • Condensed Matter Physics

Cite this

Velegol, D., & Holtzer, G. (2002). Extending differential electrophoresis to measure nanoparticle forces. In Proceedings of the 2002 2nd IEEE Conference on Nanotechnology, IEEE-NANO 2002 (pp. 343-345). [1032261] (Proceedings of the IEEE Conference on Nanotechnology; Vol. 2002-January). IEEE Computer Society. https://doi.org/10.1109/NANO.2002.1032261
Velegol, Darrell ; Holtzer, G. / Extending differential electrophoresis to measure nanoparticle forces. Proceedings of the 2002 2nd IEEE Conference on Nanotechnology, IEEE-NANO 2002. IEEE Computer Society, 2002. pp. 343-345 (Proceedings of the IEEE Conference on Nanotechnology).
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Velegol, D & Holtzer, G 2002, Extending differential electrophoresis to measure nanoparticle forces. in Proceedings of the 2002 2nd IEEE Conference on Nanotechnology, IEEE-NANO 2002., 1032261, Proceedings of the IEEE Conference on Nanotechnology, vol. 2002-January, IEEE Computer Society, pp. 343-345, 2nd IEEE Conference on Nanotechnology, IEEE-NANO 2002, Washington, United States, 8/26/02. https://doi.org/10.1109/NANO.2002.1032261

Extending differential electrophoresis to measure nanoparticle forces. / Velegol, Darrell; Holtzer, G.

Proceedings of the 2002 2nd IEEE Conference on Nanotechnology, IEEE-NANO 2002. IEEE Computer Society, 2002. p. 343-345 1032261 (Proceedings of the IEEE Conference on Nanotechnology; Vol. 2002-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Velegol D, Holtzer G. Extending differential electrophoresis to measure nanoparticle forces. In Proceedings of the 2002 2nd IEEE Conference on Nanotechnology, IEEE-NANO 2002. IEEE Computer Society. 2002. p. 343-345. 1032261. (Proceedings of the IEEE Conference on Nanotechnology). https://doi.org/10.1109/NANO.2002.1032261