Fast event recognition for X-ray silicon imagers

David N. Burrows; Eli Hughes; Tyler Anderson; Abraham D. Falcone; Karl Reichard; Mark Bautz; Ralph Kraft

doi:10.1117/12.2231005

Fast event recognition for X-ray silicon imagers

David N. Burrows, Eli Hughes, Tyler Anderson, Abraham D. Falcone, Karl Reichard, Mark Bautz, Ralph Kraft

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

Future X-ray astronomy observatories will employ high-speed silicon-based active pixel sensors to obtain wide fields of view with good radiation hardness and low levels of detector saturation (pileup). Detector readout rates envisioned for missions such as Athena and X-ray Surveyor are far too high for existing software-based event recognition techniques to be able to extract the X-ray events from the data stream. We report on the development of high-speed event recognition electronics tailored to the requirements of these new detectors.

Original language	English (US)
Title of host publication	Space Telescopes and Instrumentation 2016
Subtitle of host publication	Ultraviolet to Gamma Ray
Editors	Marshall Bautz, Tadayuki Takahashi, Jan-Willem A. den Herder
Publisher	SPIE
ISBN (Electronic)	9781510601895
DOIs	https://doi.org/10.1117/12.2231005
State	Published - Jan 1 2016
Event	Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray - Edinburgh, United Kingdom Duration: Jun 26 2016 → Jul 1 2016

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	9905
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Other

Other	Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray
Country	United Kingdom
City	Edinburgh
Period	6/26/16 → 7/1/16

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All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Cite this

Burrows, D. N., Hughes, E., Anderson, T., Falcone, A. D., Reichard, K., Bautz, M., & Kraft, R. (2016). Fast event recognition for X-ray silicon imagers. In M. Bautz, T. Takahashi, & J-W. A. den Herder (Eds.), Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray [99050L] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9905). SPIE. https://doi.org/10.1117/12.2231005

Burrows, David N. ; Hughes, Eli ; Anderson, Tyler ; Falcone, Abraham D. ; Reichard, Karl ; Bautz, Mark ; Kraft, Ralph. / Fast event recognition for X-ray silicon imagers. Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray. editor / Marshall Bautz ; Tadayuki Takahashi ; Jan-Willem A. den Herder. SPIE, 2016. (Proceedings of SPIE - The International Society for Optical Engineering).

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Burrows, DN, Hughes, E, Anderson, T , Falcone, AD , Reichard, K, Bautz, M & Kraft, R 2016, Fast event recognition for X-ray silicon imagers. in M Bautz, T Takahashi & J-WA den Herder (eds), Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray., 99050L, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9905, SPIE, Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray, Edinburgh, United Kingdom, 6/26/16. https://doi.org/10.1117/12.2231005

Fast event recognition for X-ray silicon imagers. / Burrows, David N.; Hughes, Eli; Anderson, Tyler ; Falcone, Abraham D.; Reichard, Karl; Bautz, Mark; Kraft, Ralph.

Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray. ed. / Marshall Bautz; Tadayuki Takahashi; Jan-Willem A. den Herder. SPIE, 2016. 99050L (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9905).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Burrows DN, Hughes E, Anderson T , Falcone AD , Reichard K, Bautz M et al. Fast event recognition for X-ray silicon imagers. In Bautz M, Takahashi T, den Herder J-WA, editors, Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray. SPIE. 2016. 99050L. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.2231005

Access to Document

10.1117/12.2231005