Fault tolerant signal processing for nano-scale VLSI circuit technology

W. K. Jenkins, C. Radhakrishnan, S. Pal, J. Sabarad

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Adaptive fault tolerance (AFT) takes advantage of non-canonical adaptive filter architectures that use adaptive principles to achieve automatic fault recovery. Recent work has demonstrated the capability of AFT methods to mask single and multiple stuck-at bit errors in the filter coefficients, and also to demonstrate the capability of AFT filters to resist the effects of soft errors. This paper explores several approaches to fault tolerance that can be used in VLSI adaptive filters that are prone to soft errors caused by scaling down of feature dimensions and voltage thresholds.

Original languageEnglish (US)
Title of host publicationConference Record of the 40th Asilomar Conference on Signals, Systems and Computers, ACSSC '06
Pages926-930
Number of pages5
DOIs
StatePublished - Dec 1 2006
Event40th Asilomar Conference on Signals, Systems, and Computers, ACSSC '06 - Pacific Grove, CA, United States
Duration: Oct 29 2006Nov 1 2006

Publication series

NameConference Record - Asilomar Conference on Signals, Systems and Computers
ISSN (Print)1058-6393

Other

Other40th Asilomar Conference on Signals, Systems, and Computers, ACSSC '06
CountryUnited States
CityPacific Grove, CA
Period10/29/0611/1/06

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Computer Networks and Communications

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    Jenkins, W. K., Radhakrishnan, C., Pal, S., & Sabarad, J. (2006). Fault tolerant signal processing for nano-scale VLSI circuit technology. In Conference Record of the 40th Asilomar Conference on Signals, Systems and Computers, ACSSC '06 (pp. 926-930). [4176696] (Conference Record - Asilomar Conference on Signals, Systems and Computers). https://doi.org/10.1109/ACSSC.2006.354886