Fault tolerant signal processing for nano-scale VLSI circuit technology

W. K. Jenkins, C. Radhakrishnan, S. Pal, J. Sabarad

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Adaptive fault tolerance (AFT) takes advantage of non-canonical adaptive filter architectures that use adaptive principles to achieve automatic fault recovery. Recent work has demonstrated the capability of AFT methods to mask single and multiple stuck-at bit errors in the filter coefficients, and also to demonstrate the capability of AFT filters to resist the effects of soft errors. This paper explores several approaches to fault tolerance that can be used in VLSI adaptive filters that are prone to soft errors caused by scaling down of feature dimensions and voltage thresholds.

Original languageEnglish (US)
Title of host publicationConference Record of the 40th Asilomar Conference on Signals, Systems and Computers, ACSSC '06
Pages926-930
Number of pages5
DOIs
StatePublished - Dec 1 2006
Event40th Asilomar Conference on Signals, Systems, and Computers, ACSSC '06 - Pacific Grove, CA, United States
Duration: Oct 29 2006Nov 1 2006

Other

Other40th Asilomar Conference on Signals, Systems, and Computers, ACSSC '06
CountryUnited States
CityPacific Grove, CA
Period10/29/0611/1/06

Fingerprint

VLSI circuits
Fault tolerance
Signal processing
Adaptive filters
Threshold voltage
Masks
Recovery

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Computer Networks and Communications

Cite this

Jenkins, W. K., Radhakrishnan, C., Pal, S., & Sabarad, J. (2006). Fault tolerant signal processing for nano-scale VLSI circuit technology. In Conference Record of the 40th Asilomar Conference on Signals, Systems and Computers, ACSSC '06 (pp. 926-930). [4176696] https://doi.org/10.1109/ACSSC.2006.354886
Jenkins, W. K. ; Radhakrishnan, C. ; Pal, S. ; Sabarad, J. / Fault tolerant signal processing for nano-scale VLSI circuit technology. Conference Record of the 40th Asilomar Conference on Signals, Systems and Computers, ACSSC '06. 2006. pp. 926-930
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Jenkins, WK, Radhakrishnan, C, Pal, S & Sabarad, J 2006, Fault tolerant signal processing for nano-scale VLSI circuit technology. in Conference Record of the 40th Asilomar Conference on Signals, Systems and Computers, ACSSC '06., 4176696, pp. 926-930, 40th Asilomar Conference on Signals, Systems, and Computers, ACSSC '06, Pacific Grove, CA, United States, 10/29/06. https://doi.org/10.1109/ACSSC.2006.354886

Fault tolerant signal processing for nano-scale VLSI circuit technology. / Jenkins, W. K.; Radhakrishnan, C.; Pal, S.; Sabarad, J.

Conference Record of the 40th Asilomar Conference on Signals, Systems and Computers, ACSSC '06. 2006. p. 926-930 4176696.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Jenkins WK, Radhakrishnan C, Pal S, Sabarad J. Fault tolerant signal processing for nano-scale VLSI circuit technology. In Conference Record of the 40th Asilomar Conference on Signals, Systems and Computers, ACSSC '06. 2006. p. 926-930. 4176696 https://doi.org/10.1109/ACSSC.2006.354886