Ferroelectric domain imaging by defect-luminescence microscopy

V. Dierolf, C. Sandmann, S. Kim, V. Gopalan, K. Polgar

Research output: Contribution to journalArticlepeer-review

43 Scopus citations

Abstract

The role of defects within the domain inversion process in ferroelectric LiNbO3 crystals was studied by investigating the optical properties of intentionally introduced Er3+ defect complexes. Drastic differences in the Er3+ emission were found using site-selective excitation-emission spectroscopy, which were due to a rearrangement of the defect complexes. The changes were used in a confocal luminescence microscope to image ferroelectric-domain structures.

Original languageEnglish (US)
Pages (from-to)2295-2297
Number of pages3
JournalJournal of Applied Physics
Volume93
Issue number4
DOIs
StatePublished - Feb 15 2003

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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