Ferroelectric domain imaging by defect-luminescence microscopy

V. Dierolf, C. Sandmann, S. Kim, V. Gopalan, K. Polgar

Research output: Contribution to journalArticle

43 Scopus citations

Abstract

The role of defects within the domain inversion process in ferroelectric LiNbO3 crystals was studied by investigating the optical properties of intentionally introduced Er3+ defect complexes. Drastic differences in the Er3+ emission were found using site-selective excitation-emission spectroscopy, which were due to a rearrangement of the defect complexes. The changes were used in a confocal luminescence microscope to image ferroelectric-domain structures.

Original languageEnglish (US)
Pages (from-to)2295-2297
Number of pages3
JournalJournal of Applied Physics
Volume93
Issue number4
DOIs
StatePublished - Feb 15 2003

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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