Finite difference time domain analysis for measuring transmission and reflection coefficients in negative index materials

Jae Hong Park, Iam-choon Khoo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We will discuss the reflection and transmission coefficients in the negative index materials. Based on the finite differential time domain approach, we obtain the reflection and transmission coefficients depending on permittivity and permeability at a fixed frequency. The transmissivity and reflectivity will be also examined. Simulation results are in good agreement with the theoretical ones. This technique can be easily extended to the multi-layered structure with negative index materials to design the optical system.

Original languageEnglish (US)
Title of host publication2007 International Conference on Numerical Simulation of Semiconductor Optoelectronic Devices - NUSOD'07
Pages49-50
Number of pages2
DOIs
StatePublished - Dec 1 2007
Event2007 International Conference on Numerical Simulation of Semiconductor Optoelectronic Devices - NUSOD'07 - Newark, DE, United States
Duration: Sep 24 2007Sep 28 2007

Publication series

Name2007 International Conference on Numerical Simulation of Semiconductor Optoelectronic Devices - NUSOD'07

Other

Other2007 International Conference on Numerical Simulation of Semiconductor Optoelectronic Devices - NUSOD'07
CountryUnited States
CityNewark, DE
Period9/24/079/28/07

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Fingerprint Dive into the research topics of 'Finite difference time domain analysis for measuring transmission and reflection coefficients in negative index materials'. Together they form a unique fingerprint.

  • Cite this

    Park, J. H., & Khoo, I. (2007). Finite difference time domain analysis for measuring transmission and reflection coefficients in negative index materials. In 2007 International Conference on Numerical Simulation of Semiconductor Optoelectronic Devices - NUSOD'07 (pp. 49-50). [4349018] (2007 International Conference on Numerical Simulation of Semiconductor Optoelectronic Devices - NUSOD'07). https://doi.org/10.1109/NUSOD.2007.4349018