First application of Cc corrected imaging for high-resolution and energy-filtered TEM

Bernd Kabius, Peter Hartel, Maximilian Haider, Heiko Müller, Stephan Uhlemann, Ulrich Loebau, Joachim Zach

Research output: Contribution to journalArticlepeer-review

2 Scopus citations
Original languageEnglish (US)
Pages (from-to)1456-1457
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Jul 2009

All Science Journal Classification (ASJC) codes

  • Instrumentation

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