First application of Cc corrected imaging for high-resolution and energy-filtered TEM

Bernd C. Kabius, Peter Hartel, Maximilian Haider, Heiko Müller, Stephan Uhlemann, Ulrich Loebau, Joachim Zach

Research output: Contribution to journalArticle

2 Scopus citations
Original languageEnglish (US)
Pages (from-to)1456-1457
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 1 2009

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Kabius, B. C., Hartel, P., Haider, M., Müller, H., Uhlemann, S., Loebau, U., & Zach, J. (2009). First application of Cc corrected imaging for high-resolution and energy-filtered TEM. Microscopy and Microanalysis, 15(SUPPL. 2), 1456-1457. https://doi.org/10.1017/S1431927609098547