First application of Cc-corrected imaging for high-resolution and energy-filtered TEM

Bernd Kabius, Peter Hartel, Maximilian Haider, Heiko Müller, Stephan Uhlemann, Ulrich Loebau, Joachim Zach, Harald Rose

Research output: Contribution to journalArticle

83 Scopus citations

Abstract

Contrast-transfer calculations indicate that Cc correction should be highly beneficial for high-resolution and energy-filtered transmission electron microscopy. A prototype of an electron optical system capable of correcting spherical and chromatic aberration has been used to verify these calculations. A strong improvement in resolution at an acceleration voltage of 80 kV has been measured. Our first Cc-corrected energy-filtered experiments examining a (LaAlO3)0.3(Sr2AlTaO6)0.7LaCoO3 interface demonstrated a significant gain for the spatial resolution in elemental maps of La.

Original languageEnglish (US)
Pages (from-to)147-155
Number of pages9
JournalJournal of Electron Microscopy
Volume58
Issue number3
DOIs
StatePublished - Jun 1 2009

All Science Journal Classification (ASJC) codes

  • Instrumentation

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    Kabius, B., Hartel, P., Haider, M., Müller, H., Uhlemann, S., Loebau, U., Zach, J., & Rose, H. (2009). First application of Cc-corrected imaging for high-resolution and energy-filtered TEM. Journal of Electron Microscopy, 58(3), 147-155. https://doi.org/10.1093/jmicro/dfp021