TY - GEN
T1 - FLAW
T2 - FPGA lifetime awareness
AU - Srinivasan, Suresh
AU - Mangalagiri, Prasanth
AU - Xie, Yuan
AU - Vijaykrishnan, N.
AU - Sarpatwari, Karthik
PY - 2006/12/1
Y1 - 2006/12/1
N2 - Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vulnerable to permanent damage and failures due to different physical phenomenon. Such concerns have been recently demonstrated for regular micro-architectures. In this work we demonstrate the vulnerability of Field Programmable Gate Arrays (FPGA)s to two different types of hard errors, namely, Time Dependent Dielectric Breakdown (TDDB) and Electro-migration. We also analyze the performance degradation of FPGAs over time caused by Hot Carrier Effects (HCE). We also propose three novel techniques to counter such aging based failures and increase the lifetime of the device.
AB - Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vulnerable to permanent damage and failures due to different physical phenomenon. Such concerns have been recently demonstrated for regular micro-architectures. In this work we demonstrate the vulnerability of Field Programmable Gate Arrays (FPGA)s to two different types of hard errors, namely, Time Dependent Dielectric Breakdown (TDDB) and Electro-migration. We also analyze the performance degradation of FPGAs over time caused by Hot Carrier Effects (HCE). We also propose three novel techniques to counter such aging based failures and increase the lifetime of the device.
UR - http://www.scopus.com/inward/record.url?scp=34547225235&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34547225235&partnerID=8YFLogxK
U2 - 10.1145/1146909.1147070
DO - 10.1145/1146909.1147070
M3 - Conference contribution
AN - SCOPUS:34547225235
SN - 1595933816
SN - 1595933816
SN - 9781595933812
T3 - Proceedings - Design Automation Conference
SP - 630
EP - 635
BT - 2006 43rd ACM/IEEE Design Automation Conference, DAC'06
ER -