Flight test results of a synthetic vision elevation database integrity monitor

Maarten Uijt de Haag, J. Sayre, Jacob Campbell, Steve Young, Robert Gray

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

This paper discusses the flight test results of a real-time Digital Elevation Model (DEM) integrity monitor for Civil Aviation applications. Providing pilots with Synthetic Vision (SV) displays containing terrain information has the potential to improve flight safety by improving situational awareness and thereby reducing the likelihood of Controlled Flight Into Terrain (CFIT). Utilization of DEMs, such as the digital terrain elevation data (DTED), requires a DEM integrity check and timely integrity alerts to the pilots when used for flight-critical terrain-displays, otherwise the DEM may provide hazardous misleading terrain information. The discussed integrity monitor checks the consistency between a terrain elevation profile synthesized from sensor information, and the profile given in the DEM. The synthesized profile is derived from DGPS and radar altimeter measurements. DEMs of various spatial resolutions are used to illustrate the dependency of the integrity monitor's performance on the DEMs spatial resolution. The paper will give a description of proposed integrity algorithms, the flight test setup, and the results of a flight test performed at the Ohio University airport and in the vicinity of Asheville, NC

Original languageEnglish (US)
Pages (from-to)124-133
Number of pages10
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4363
Issue number1
DOIs
StatePublished - Aug 28 2001

Fingerprint

enhanced vision
flight tests
integrity
Integrity
monitors
Digital Elevation Model
digital elevation models
Monitor
Radio altimeters
Display devices
Spatial Resolution
Civil aviation
Display
profiles
spatial resolution
flight safety
civil aviation
Airports
radio altimeters
flight

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Uijt de Haag, Maarten ; Sayre, J. ; Campbell, Jacob ; Young, Steve ; Gray, Robert. / Flight test results of a synthetic vision elevation database integrity monitor. In: Proceedings of SPIE - The International Society for Optical Engineering. 2001 ; Vol. 4363, No. 1. pp. 124-133.
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Flight test results of a synthetic vision elevation database integrity monitor. / Uijt de Haag, Maarten; Sayre, J.; Campbell, Jacob; Young, Steve; Gray, Robert.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 4363, No. 1, 28.08.2001, p. 124-133.

Research output: Contribution to journalArticle

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