Frequency shift imaging of quantum dots with single-electron resolution

J. Zhu, M. Brink, P. L. McEuen

Research output: Contribution to journalArticle

31 Scopus citations

Abstract

We employ atomic force microscope-based frequency shift microscopy to study the electronic properties of quantum dots formed in carbon nanotubes. The nontransport detection scheme of frequency shift allows us to probe nearly isolated quantum dots in a few electron regime. At 4 K, we observe Coulomb oscillations of quantum dots with single-electron resolution and extract the charging energy of a quantum dot.

Original languageEnglish (US)
Article number242102
Pages (from-to)1-3
Number of pages3
JournalApplied Physics Letters
Volume87
Issue number24
DOIs
StatePublished - Dec 19 2005

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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