Grain growth in nanocrystalline nickel films at low temperature and stress

B. Wang, M. T. Alam, M. A. Haque

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

The influence of temperature and stress on grain growth was investigated in nanocrystalline nickel thin films in situ inside a transmission electron microscope. Independently, temperature and stress did not show any appreciable effect. However, concurrent loading at only 20% of melting temperature and 20% of yield stress resulted in significant grain boundary mobility and grain growth. We propose that grain growth in nanocrystals is a stress-heterogeneity- relieving mechanism that may not necessarily be associated with plasticity as proposed in the literature.

Original languageEnglish (US)
Pages (from-to)1-4
Number of pages4
JournalScripta Materialia
Volume71
DOIs
StatePublished - Jan 1 2014

Fingerprint

Nickel
Grain growth
nickel
Stress relief
relieving
Nanocrystals
Temperature
Plasticity
Yield stress
Melting point
Grain boundaries
Electron microscopes
plastic properties
temperature
Thin films
nanocrystals
grain boundaries
electron microscopes
melting
thin films

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys

Cite this

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Grain growth in nanocrystalline nickel films at low temperature and stress. / Wang, B.; Alam, M. T.; Haque, M. A.

In: Scripta Materialia, Vol. 71, 01.01.2014, p. 1-4.

Research output: Contribution to journalArticle

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