Growth and characterization of ZnO/MgZnO composite structures grown by pulsed laser deposition

Jimmy Yao, Tianjing Li, Yaohui Gao, Qi Li, Shizhuo Yin, Claire Luo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, the growth of ZnO/MgZnO composite structures with a larger number of periods by pulsed laser deposition is presented. The structural and physical properties are quantitatively characterized by field-emission scanning electron microscopy, transmission electronic microscopy, X-ray diffraction, and photoluminescence. It is demonstrated that the quantum confinement effect has been observed from the composite structures at room temperature. The applications of this unique ZnO/MgZnO composite structure are also discussed.

Original languageEnglish (US)
Title of host publicationPhotonic Fiber and Crystal Devices
Subtitle of host publicationAdvances in Materials and Innovations in Device Applications V
DOIs
Publication statusPublished - Oct 11 2011
EventPhotonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications V - San Diego, CA, United States
Duration: Aug 21 2011Aug 22 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8120
ISSN (Print)0277-786X

Other

OtherPhotonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications V
CountryUnited States
CitySan Diego, CA
Period8/21/118/22/11

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Yao, J., Li, T., Gao, Y., Li, Q., Yin, S., & Luo, C. (2011). Growth and characterization of ZnO/MgZnO composite structures grown by pulsed laser deposition. In Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications V [81201J] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8120). https://doi.org/10.1117/12.894656