Growth and reliability of thick gate oxide in U-trench for power MOSFET's

C. T. Wu, R. S. Ridley, G. Dolny, T. Grebs, C. Knoedler, S. Suliman, B. Venkataraman, O. Awadelkarim, J. Ruzyllo

Research output: Contribution to conferencePaperpeer-review

4 Scopus citations

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Engineering & Materials Science