Growth characterization of YBa2Cu3O7 -x thin films on (100) MgO

Q. Li, O. Meyer, X. X. Xi, J. Geerk, G. Linker

Research output: Contribution to journalArticle

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Abstract

The growth features of YBa2Cu3O7 -x thin films on (100) MgO substrates were studied by He ion channeling and x-ray diffraction measurements. A minimum yield value of 7% at 2 MeV He ion energy and a standard deviation of the crystallite misorientation of only 0.1° show that epitaxial growth (c-axis oriented) is achieved despite a large lattice mismatch of about 9% between the film and the substrate. Detailed studies of the energy dependence of the dechanneling yield at the film-substrate interface for films of different thickness reveal the presence of dislocations probably formed by strain relief in the initial state of growth. Stacking faults appear as the main defect structure in the bulk of the films.

Original languageEnglish (US)
Pages (from-to)310-312
Number of pages3
JournalApplied Physics Letters
Volume55
Issue number3
DOIs
StatePublished - Dec 1 1989

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thin films
crystal defects
misalignment
standard deviation
ions
x ray diffraction
energy
defects

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Li, Q. ; Meyer, O. ; Xi, X. X. ; Geerk, J. ; Linker, G. / Growth characterization of YBa2Cu3O7 -x thin films on (100) MgO. In: Applied Physics Letters. 1989 ; Vol. 55, No. 3. pp. 310-312.
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Li, Q, Meyer, O, Xi, XX, Geerk, J & Linker, G 1989, 'Growth characterization of YBa2Cu3O7 -x thin films on (100) MgO', Applied Physics Letters, vol. 55, no. 3, pp. 310-312. https://doi.org/10.1063/1.102413

Growth characterization of YBa2Cu3O7 -x thin films on (100) MgO. / Li, Q.; Meyer, O.; Xi, X. X.; Geerk, J.; Linker, G.

In: Applied Physics Letters, Vol. 55, No. 3, 01.12.1989, p. 310-312.

Research output: Contribution to journalArticle

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