Hardware trojan based security issues in home area network: A testbed setup

Hawzhin Mohammed, Jimmy Howell, Syed Rafay Hasan, Nan Guo, Faiq Khalid, Omar Elkeelany

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

Advanced Metering Infrastructure (AMI) is the main player in todays Smart Grid, and Home Area Network (HAN) is an important subsystem in AMI. HAN connects the smart home appliances (SHA) inside the home to the smart meter (SM), which is connected to the power utility company. In the last decade, hardware Trojans (HT), have been extensively studied in both academia and industry. Consequently, the vulnerability of integrated circuits (ICs) against HTs leads to the potential security threat to any system that contains ICs, and HAN is no exception. However, to the best of authors knowledge, the potential effect of HTs on HAN has not been studied in the literature so far. In this paper, we are investigating HT in HAN network. In the process, we developed a testbed which can be scalable up to 127 nodes using I 2 C interface to control and implement any kind of required network behavior. We introduced three possible scenarios of HTs in this HAN network testbed. These scenarios illustrate the manifestation of HTs in the HAN that leads to network performance degradation.

Original languageEnglish (US)
Title of host publication2018 IEEE 61st International Midwest Symposium on Circuits and Systems, MWSCAS 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages972-975
Number of pages4
ISBN (Electronic)9781538673928
DOIs
StatePublished - Jan 22 2019
Event61st IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2018 - Windsor, Canada
Duration: Aug 5 2018Aug 8 2018

Publication series

NameMidwest Symposium on Circuits and Systems
Volume2018-August
ISSN (Print)1548-3746

Conference

Conference61st IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2018
Country/TerritoryCanada
CityWindsor
Period8/5/188/8/18

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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