Hierarchical Soft Error Estimation Tool (HSEET)

K. Ramakrishnan, R. Rajaraman, Vijaykrishnan Narayanan, Y. Xie, Mary Jane Irwin, Kenan Unlu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

18 Citations (Scopus)

Abstract

Radiation induced soft errors have become an important reliability concern in the sub-nanometer regime. Therefore, it is imperative to devise methods to predict the Soft Error Rates (SER) quickly and accurately in combinational circuits. In this paper, we present a novel technique and a tool to compute the SERs of designs employing hierarchical architectures such as adders and multipliers. The technique uses pre-characterized blocks for current generation and propagation and probability theory to estimate the SER in hierarchical architectures. The analysis results of different hierarchical architectures, based on characterization of basic blocks such as muxes, counters and partial product generators using the new technique, are presented in this paper. The run time for most of the designs were in the order of few minutes and we obtain an average speedup of 14084X times over HSPICE and 12.25X times over a contemporary tool SEAT-LA. We have also demonstrated the scalability of our technique for various hierarchical circuits. Our technique can also be extended to any block based architecture.

Original languageEnglish (US)
Title of host publicationProceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008
Pages680-683
Number of pages4
DOIs
StatePublished - Aug 27 2008
Event9th International Symposium on Quality Electronic Design, ISQED 2008 - San Jose, CA, United States
Duration: Mar 17 2008Mar 19 2008

Publication series

NameProceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008

Other

Other9th International Symposium on Quality Electronic Design, ISQED 2008
CountryUnited States
CitySan Jose, CA
Period3/17/083/19/08

Fingerprint

Error analysis
Combinatorial circuits
Adders
Scalability
Radiation
Networks (circuits)

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Ramakrishnan, K., Rajaraman, R., Narayanan, V., Xie, Y., Irwin, M. J., & Unlu, K. (2008). Hierarchical Soft Error Estimation Tool (HSEET). In Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008 (pp. 680-683). [4479819] (Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008). https://doi.org/10.1109/ISQED.2008.4479819
Ramakrishnan, K. ; Rajaraman, R. ; Narayanan, Vijaykrishnan ; Xie, Y. ; Irwin, Mary Jane ; Unlu, Kenan. / Hierarchical Soft Error Estimation Tool (HSEET). Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008. 2008. pp. 680-683 (Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008).
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Ramakrishnan, K, Rajaraman, R, Narayanan, V, Xie, Y, Irwin, MJ & Unlu, K 2008, Hierarchical Soft Error Estimation Tool (HSEET). in Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008., 4479819, Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008, pp. 680-683, 9th International Symposium on Quality Electronic Design, ISQED 2008, San Jose, CA, United States, 3/17/08. https://doi.org/10.1109/ISQED.2008.4479819

Hierarchical Soft Error Estimation Tool (HSEET). / Ramakrishnan, K.; Rajaraman, R.; Narayanan, Vijaykrishnan; Xie, Y.; Irwin, Mary Jane; Unlu, Kenan.

Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008. 2008. p. 680-683 4479819 (Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Ramakrishnan K, Rajaraman R, Narayanan V, Xie Y, Irwin MJ, Unlu K. Hierarchical Soft Error Estimation Tool (HSEET). In Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008. 2008. p. 680-683. 4479819. (Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008). https://doi.org/10.1109/ISQED.2008.4479819