High frequency properties of piezoceramic resonators

Michael J. Zipparo, K. Kirk Shung, Thomas R. Shrout

Research output: Contribution to conferencePaper

5 Scopus citations

Abstract

Several methods of calculating the material properties of thickness mode resonators from electrical impedance measurements have been studied. A method accurate at frequencies up to 100 MHz has been used to measure the properties of several commercially available PZT compositions over the frequency range of from 5 to 100 MHz. New materials with sub micron grain sizes have also been evaluated and found to have properties less dependent on frequency. A commercial lead titanate material was evaluated and found to have properties comparable to PZT, but with a much lower dielectric constant. The dielectric permittivity of a material is shown to be particularly important in determining transducer performance due to electrical matching.

Original languageEnglish (US)
Pages35-38
Number of pages4
StatePublished - Dec 1 1996
EventProceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2) - East Brunswick, NJ, USA
Duration: Aug 18 1996Aug 21 1996

Other

OtherProceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2)
CityEast Brunswick, NJ, USA
Period8/18/968/21/96

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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    Zipparo, M. J., Shung, K. K., & Shrout, T. R. (1996). High frequency properties of piezoceramic resonators. 35-38. Paper presented at Proceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2), East Brunswick, NJ, USA, .