High-power continuous-wave laser-induced damage to complementary metal-oxide semiconductor image sensor

Jin Gyum Kim, Sungho Choi, Sunghee Yoon, Kyung Young Jhang, Wan Soon Shin

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

This paper presents the results of an experimental analysis of the high-power laser (HPL)-induced damage to a complementary metal-oxide semiconductor (CMOS) image sensor. Although the laser-induced damages to metallic materials have been sufficiently investigated, the damages to electric-optic imaging systems, which are very sensitive to HPLs, have not been studied in detail. In this study, we experimentally analyzed the HPL-induced damages to a CMOS image sensor. A near-infrared continuous-wave (CW) fiber laser was used as the laser source. The influences of the irradiance and irradiation time on the permanent damages to a CMOS image sensor, such as the color error and breakdown, were investigated. The experimental results showed that the color error occurred first, and then the breakdown occurred with an increase in the irradiance and irradiation time. In particular, these damages were more affected by the irradiance than the irradiation time.

Original languageEnglish (US)
Pages (from-to)105-109
Number of pages5
JournalTransactions of the Korean Society of Mechanical Engineers, A
Volume39
Issue number1
DOIs
StatePublished - Jan 1 2015

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Laser damage
Continuous wave lasers
High power lasers
Image sensors
Irradiation
Metals
Color
Fiber lasers
Imaging systems
Optics
Infrared radiation
Lasers
Oxide semiconductors

All Science Journal Classification (ASJC) codes

  • Mechanical Engineering

Cite this

Kim, Jin Gyum ; Choi, Sungho ; Yoon, Sunghee ; Jhang, Kyung Young ; Shin, Wan Soon. / High-power continuous-wave laser-induced damage to complementary metal-oxide semiconductor image sensor. In: Transactions of the Korean Society of Mechanical Engineers, A. 2015 ; Vol. 39, No. 1. pp. 105-109.
@article{3559df0e236d46338a3fe407b5fa5a33,
title = "High-power continuous-wave laser-induced damage to complementary metal-oxide semiconductor image sensor",
abstract = "This paper presents the results of an experimental analysis of the high-power laser (HPL)-induced damage to a complementary metal-oxide semiconductor (CMOS) image sensor. Although the laser-induced damages to metallic materials have been sufficiently investigated, the damages to electric-optic imaging systems, which are very sensitive to HPLs, have not been studied in detail. In this study, we experimentally analyzed the HPL-induced damages to a CMOS image sensor. A near-infrared continuous-wave (CW) fiber laser was used as the laser source. The influences of the irradiance and irradiation time on the permanent damages to a CMOS image sensor, such as the color error and breakdown, were investigated. The experimental results showed that the color error occurred first, and then the breakdown occurred with an increase in the irradiance and irradiation time. In particular, these damages were more affected by the irradiance than the irradiation time.",
author = "Kim, {Jin Gyum} and Sungho Choi and Sunghee Yoon and Jhang, {Kyung Young} and Shin, {Wan Soon}",
year = "2015",
month = "1",
day = "1",
doi = "10.3795/KSME-A.2015.39.1.105",
language = "English (US)",
volume = "39",
pages = "105--109",
journal = "Transactions of the Korean Society of Mechanical Engineers, A",
issn = "1226-4873",
publisher = "Korean Society of Mechanical Engineers",
number = "1",

}

High-power continuous-wave laser-induced damage to complementary metal-oxide semiconductor image sensor. / Kim, Jin Gyum; Choi, Sungho; Yoon, Sunghee; Jhang, Kyung Young; Shin, Wan Soon.

In: Transactions of the Korean Society of Mechanical Engineers, A, Vol. 39, No. 1, 01.01.2015, p. 105-109.

Research output: Contribution to journalArticle

TY - JOUR

T1 - High-power continuous-wave laser-induced damage to complementary metal-oxide semiconductor image sensor

AU - Kim, Jin Gyum

AU - Choi, Sungho

AU - Yoon, Sunghee

AU - Jhang, Kyung Young

AU - Shin, Wan Soon

PY - 2015/1/1

Y1 - 2015/1/1

N2 - This paper presents the results of an experimental analysis of the high-power laser (HPL)-induced damage to a complementary metal-oxide semiconductor (CMOS) image sensor. Although the laser-induced damages to metallic materials have been sufficiently investigated, the damages to electric-optic imaging systems, which are very sensitive to HPLs, have not been studied in detail. In this study, we experimentally analyzed the HPL-induced damages to a CMOS image sensor. A near-infrared continuous-wave (CW) fiber laser was used as the laser source. The influences of the irradiance and irradiation time on the permanent damages to a CMOS image sensor, such as the color error and breakdown, were investigated. The experimental results showed that the color error occurred first, and then the breakdown occurred with an increase in the irradiance and irradiation time. In particular, these damages were more affected by the irradiance than the irradiation time.

AB - This paper presents the results of an experimental analysis of the high-power laser (HPL)-induced damage to a complementary metal-oxide semiconductor (CMOS) image sensor. Although the laser-induced damages to metallic materials have been sufficiently investigated, the damages to electric-optic imaging systems, which are very sensitive to HPLs, have not been studied in detail. In this study, we experimentally analyzed the HPL-induced damages to a CMOS image sensor. A near-infrared continuous-wave (CW) fiber laser was used as the laser source. The influences of the irradiance and irradiation time on the permanent damages to a CMOS image sensor, such as the color error and breakdown, were investigated. The experimental results showed that the color error occurred first, and then the breakdown occurred with an increase in the irradiance and irradiation time. In particular, these damages were more affected by the irradiance than the irradiation time.

UR - http://www.scopus.com/inward/record.url?scp=84938242499&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84938242499&partnerID=8YFLogxK

U2 - 10.3795/KSME-A.2015.39.1.105

DO - 10.3795/KSME-A.2015.39.1.105

M3 - Article

AN - SCOPUS:84938242499

VL - 39

SP - 105

EP - 109

JO - Transactions of the Korean Society of Mechanical Engineers, A

JF - Transactions of the Korean Society of Mechanical Engineers, A

SN - 1226-4873

IS - 1

ER -