High-resolution topograms of fingerprints using multiwavelength digital holography

Ujitha Abeywickrema, Partha Banerjee, Akash Kota, Stephen E. Swiontek, Akhlesh Lakhtakia

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Fingerprint analysis is a popular identification technique due to the uniqueness of fingerprints and the convenience of recording them. The quality of a latent fingerprint on a surface can depend on various conditions, such as the time of the day, temperature, and the composition of sweat. We first developed latent fingerprints on transparent and blackened glass slides by depositing 1000-nm-thick columnar thin films (CTFs) of chalcogenide glass of nominal composition Ge28Sb12Se60. Then, we used transmission-/reflection-mode multiwavelength digital holography to construct the topograms of CTF-developed fingerprints on transparent/blackened glass slides. The two wavelengths chosen were 514.5 and 457.9 nm, yielding a synthetic wavelength of 4.1624 μm, which is sufficient to resolve pores of depths 1 to 2 μm. Thus, our method can be used to measure the level-3 details that are usually difficult to observe with most other techniques applied to latent fingerprints.

Original languageEnglish (US)
Article number034117
JournalOptical Engineering
Volume56
Issue number3
DOIs
StatePublished - Mar 1 2017

Fingerprint

Holography
holography
chutes
Glass
glass
high resolution
sweat
Thin films
Wavelength
uniqueness
thin films
Laser modes
Chemical analysis
wavelengths
recording
porosity
Temperature
temperature

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Engineering(all)

Cite this

Abeywickrema, Ujitha ; Banerjee, Partha ; Kota, Akash ; Swiontek, Stephen E. ; Lakhtakia, Akhlesh. / High-resolution topograms of fingerprints using multiwavelength digital holography. In: Optical Engineering. 2017 ; Vol. 56, No. 3.
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High-resolution topograms of fingerprints using multiwavelength digital holography. / Abeywickrema, Ujitha; Banerjee, Partha; Kota, Akash; Swiontek, Stephen E.; Lakhtakia, Akhlesh.

In: Optical Engineering, Vol. 56, No. 3, 034117, 01.03.2017.

Research output: Contribution to journalArticle

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