We present a general strategy to increase the thermal stability of the hole transport layer in common small molecule OLEDs by >50°C without adversely affecting their electrical characteristics.
|Original language||English (US)|
|Number of pages||1|
|Journal||Digest of Technical Papers - SID International Symposium|
|State||Published - Jan 1 2017|
|Event||SID Symposium, Seminar, and Exhibition 2017, Display Week 2017 - Los Angeles, United States|
Duration: May 21 2017 → May 26 2017
All Science Journal Classification (ASJC) codes