Highly accelerated lifetime testing (HALT) of lead zirconate titanate (PZT) thin films

R. G. Polcawich, C. Feng, P. Vanatta, R. Piekarz, Susan E. Trolier-McKinstry, M. Dubey, M. Ervin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

Abstract

The lifetime of PZT films under dc field is relevant for both capacitive and electromechanical applications. To assess the factors controlling the lifetime, a series of highly accelerated lifetime tests (HALT) were performed on ∼0.88 μm thick sol-gel PZT (52/48) thin films exposed to temperatures ranging from 100°C to 180°C and electric fields ranging from 284 to 455 kV/cm. Using a lognormal plot of failure times to represent the data, an S-shaped pattern, indicative of two failure modes, is observed. The later failures represent the limiting device lifetimes and these values that were used to compute lifetime prediction values. It was found that the activation energy for failure was ∼1.1 eV and the voltage acceleration factor was ∼5.3. Scanning electron microscopy analysis revealed that arc discharge is the most prominent failure mechanism during operation.

Original languageEnglish (US)
Title of host publicationIEEE International Symposium on Applications of Ferroelectrics
EditorsS K Streiffer, B J Gibbons, T Tsurumi
Pages357-360
Number of pages4
Volume1
StatePublished - 2000
Event12th IEEE International Symposium on Applications of Ferroelectrics - Honolulu, HI, United States
Duration: Jul 21 2000Aug 2 2000

Other

Other12th IEEE International Symposium on Applications of Ferroelectrics
CountryUnited States
CityHonolulu, HI
Period7/21/008/2/00

Fingerprint

Failure modes
Sol-gels
Activation energy
Electric fields
Thin films
Scanning electron microscopy
Testing
Electric potential
Temperature
lead titanate zirconate

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Materials Science(all)

Cite this

Polcawich, R. G., Feng, C., Vanatta, P., Piekarz, R., Trolier-McKinstry, S. E., Dubey, M., & Ervin, M. (2000). Highly accelerated lifetime testing (HALT) of lead zirconate titanate (PZT) thin films. In S. K. Streiffer, B. J. Gibbons, & T. Tsurumi (Eds.), IEEE International Symposium on Applications of Ferroelectrics (Vol. 1, pp. 357-360)
Polcawich, R. G. ; Feng, C. ; Vanatta, P. ; Piekarz, R. ; Trolier-McKinstry, Susan E. ; Dubey, M. ; Ervin, M. / Highly accelerated lifetime testing (HALT) of lead zirconate titanate (PZT) thin films. IEEE International Symposium on Applications of Ferroelectrics. editor / S K Streiffer ; B J Gibbons ; T Tsurumi. Vol. 1 2000. pp. 357-360
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Polcawich, RG, Feng, C, Vanatta, P, Piekarz, R, Trolier-McKinstry, SE, Dubey, M & Ervin, M 2000, Highly accelerated lifetime testing (HALT) of lead zirconate titanate (PZT) thin films. in SK Streiffer, BJ Gibbons & T Tsurumi (eds), IEEE International Symposium on Applications of Ferroelectrics. vol. 1, pp. 357-360, 12th IEEE International Symposium on Applications of Ferroelectrics, Honolulu, HI, United States, 7/21/00.

Highly accelerated lifetime testing (HALT) of lead zirconate titanate (PZT) thin films. / Polcawich, R. G.; Feng, C.; Vanatta, P.; Piekarz, R.; Trolier-McKinstry, Susan E.; Dubey, M.; Ervin, M.

IEEE International Symposium on Applications of Ferroelectrics. ed. / S K Streiffer; B J Gibbons; T Tsurumi. Vol. 1 2000. p. 357-360.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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AU - Polcawich, R. G.

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AB - The lifetime of PZT films under dc field is relevant for both capacitive and electromechanical applications. To assess the factors controlling the lifetime, a series of highly accelerated lifetime tests (HALT) were performed on ∼0.88 μm thick sol-gel PZT (52/48) thin films exposed to temperatures ranging from 100°C to 180°C and electric fields ranging from 284 to 455 kV/cm. Using a lognormal plot of failure times to represent the data, an S-shaped pattern, indicative of two failure modes, is observed. The later failures represent the limiting device lifetimes and these values that were used to compute lifetime prediction values. It was found that the activation energy for failure was ∼1.1 eV and the voltage acceleration factor was ∼5.3. Scanning electron microscopy analysis revealed that arc discharge is the most prominent failure mechanism during operation.

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Polcawich RG, Feng C, Vanatta P, Piekarz R, Trolier-McKinstry SE, Dubey M et al. Highly accelerated lifetime testing (HALT) of lead zirconate titanate (PZT) thin films. In Streiffer SK, Gibbons BJ, Tsurumi T, editors, IEEE International Symposium on Applications of Ferroelectrics. Vol. 1. 2000. p. 357-360