The epitaxial growth and microstructure of YBa2Cu3O7 thin films on (110) SrTiO3 substrates was investigated by high-resolution electron microscopy. The single thin films and heterostructures with PrBa2Cu3O7 and SrTiO3 separating the superconductor layers were deposited by DC sputtering. All layers were grown with the  direction perpendicular to the substrate surface with the c-axis of the YBa2Cu3O7 film oriented parallel to the  direction of the substrate. Resistance measurements showed that, by applying a template growth procedure, Tc values of up to 85 K can be obtained. Stacking faults were found to be the dominant defect type in the superconducting film. A structural model for a novel type of these defects inducing a local 2-3-5 cation stoichiometry was deduced by comparison between experimental and simulated high-resolution images. Antiphase boundaries with a habit plane close to the (110) plane of YBa2Cu3O7 were detected.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering