Identifying design requirements using integrated analysis structures

Daniel E. Snyder, Michael D. McNeese, Brian S. Zaff

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

The authors present some of the analytical and design foundations for an integrated analysis structure for knowledge acquisition and design. Concept maps, IDEF (integrated computer-aided manufacturing definition), and storyboards are combined into an integrated structure for knowledge representation, called cognitive maps, and a hypermedia-based analytical framework is established using graphical spreadsheets. The authors describe the preliminary results of a project to define this hypermedia environment and integrated software.

Original languageEnglish (US)
Title of host publicationIEEE Proceedings of the National Aerospace and Electronics Conference
PublisherPubl by IEEE
Pages786-792
Number of pages7
Volume2
StatePublished - 1991
EventProceedings of the IEEE 1991 National Aerospace and Electronics Conference - NAECON 1991 - Dayton, OH, USA
Duration: May 20 1991May 24 1991

Other

OtherProceedings of the IEEE 1991 National Aerospace and Electronics Conference - NAECON 1991
CityDayton, OH, USA
Period5/20/915/24/91

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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