Image reconstruction of flaws using ramp response signatures

V. V. Varadan, S. J. Tsao, V. K. Varadan, B. R. Tittmann

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A new method for generating three dimensional images of flaws in elastic solids from backscattered data at a finite number of look angles (usually 2 to 3) is presented. The procedure is based on the physical elastodynamics aporoximation which leads to a relationship between the backscattered ramp response to an incident ultrasonic ramp pulse and the area of cross section of the object along the “line of sight.”

Original languageEnglish (US)
Pages (from-to)293-300
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume768
DOIs
StatePublished - Sep 10 1987

Fingerprint

Elastodynamics
Image Reconstruction
image reconstruction
ramps
Image reconstruction
Cross section
Signature
Ultrasonics
signatures
Angle
elastodynamics
Three-dimensional
Defects
Line
defects
line of sight
ultrasonics
cross sections
pulses
Object

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Varadan, V. V. ; Tsao, S. J. ; Varadan, V. K. ; Tittmann, B. R. / Image reconstruction of flaws using ramp response signatures. In: Proceedings of SPIE - The International Society for Optical Engineering. 1987 ; Vol. 768. pp. 293-300.
@article{3efa0698f41645a9a2f2cfe787908745,
title = "Image reconstruction of flaws using ramp response signatures",
abstract = "A new method for generating three dimensional images of flaws in elastic solids from backscattered data at a finite number of look angles (usually 2 to 3) is presented. The procedure is based on the physical elastodynamics aporoximation which leads to a relationship between the backscattered ramp response to an incident ultrasonic ramp pulse and the area of cross section of the object along the “line of sight.”",
author = "Varadan, {V. V.} and Tsao, {S. J.} and Varadan, {V. K.} and Tittmann, {B. R.}",
year = "1987",
month = "9",
day = "10",
doi = "10.1117/12.940280",
language = "English (US)",
volume = "768",
pages = "293--300",
journal = "Proceedings of SPIE - The International Society for Optical Engineering",
issn = "0277-786X",
publisher = "SPIE",

}

Image reconstruction of flaws using ramp response signatures. / Varadan, V. V.; Tsao, S. J.; Varadan, V. K.; Tittmann, B. R.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 768, 10.09.1987, p. 293-300.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Image reconstruction of flaws using ramp response signatures

AU - Varadan, V. V.

AU - Tsao, S. J.

AU - Varadan, V. K.

AU - Tittmann, B. R.

PY - 1987/9/10

Y1 - 1987/9/10

N2 - A new method for generating three dimensional images of flaws in elastic solids from backscattered data at a finite number of look angles (usually 2 to 3) is presented. The procedure is based on the physical elastodynamics aporoximation which leads to a relationship between the backscattered ramp response to an incident ultrasonic ramp pulse and the area of cross section of the object along the “line of sight.”

AB - A new method for generating three dimensional images of flaws in elastic solids from backscattered data at a finite number of look angles (usually 2 to 3) is presented. The procedure is based on the physical elastodynamics aporoximation which leads to a relationship between the backscattered ramp response to an incident ultrasonic ramp pulse and the area of cross section of the object along the “line of sight.”

UR - http://www.scopus.com/inward/record.url?scp=0023540799&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0023540799&partnerID=8YFLogxK

U2 - 10.1117/12.940280

DO - 10.1117/12.940280

M3 - Article

AN - SCOPUS:0023540799

VL - 768

SP - 293

EP - 300

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

ER -